Testing method of beta-form crystal content in non-planar polypropylene material
A polypropylene material and testing method technology, applied in the analysis of materials, using wave/particle radiation for material analysis, measuring devices, etc., can solve the problems that affect the content of β crystals, cannot truly reflect the content of β crystals, and large system errors, etc. To achieve the effect of accurate content determination
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Embodiment 1
[0028] A test method for beta crystal content in non-planar polypropylene material, comprising the following steps:
[0029] Sample preparation method: from d n Cut a 2cm pipe section from a 25mm S2.5 β crystal form PP-RCT pipe fitting, use a slicer to cut out a relatively flat plane, and then polish it sequentially with a 300-mesh, 500-mesh, and 1000-mesh whetstone (not suitable for direct grinding, and the number of times of grinding is limited) Too much heat will cause crystal phase transformation), and a 1cm×1cm plane is produced.
[0030] Through the above method, the β→α transformation in the preparation process is minimized. The prepared sample adopts 4° / min scanning speed to measure the XRD spectrum of the sample, as figure 1 shown.
[0031] Use MDI Jade software to subtract the background (reduce the influence of thermal slow scattering, air scattering, fluorescence and electronic noise, etc.), smooth the line (reduce the influence of accidental factors), divide th...
Embodiment 2
[0037] A test method for beta crystal content in non-planar polypropylene material, comprising the following steps:
[0038] Sample preparation method: from d n Cut a 2cm pipe section from a 25mm S2.5 β crystal form PP-RCT pipe fitting, and grind it for 40 minutes with a liquid nitrogen freezing grinder at a temperature of -35°C, and sieve it to control the particle size of the ground powder to about 20 μm.
[0039] Through the above method, the β→α transformation in the preparation process is minimized. The prepared sample adopts 4° / min scanning speed to measure the XRD spectrum of the sample, as image 3 shown.
[0040] Use MDI Jade software to subtract the background (reduce the influence of thermal slow scattering, air scattering, fluorescence and electronic noise, etc.), smooth the line (reduce the influence of accidental factors), divide the peaks and refine the fitting, such as Figure 4 shown.
[0041] According to the data obtained by the peak splitting process, t...
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