Positioning method for short wavelength X-ray diffraction testing sample

A technology for testing samples and positioning methods, which is applied in the field of X-ray diffraction detection to ensure accuracy and high precision

Active Publication Date: 2019-02-22
NO 59 RES INST OF CHINA ORDNANCE IND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, based on this device and other existing literature, there is no positioning method that can accurately place a certain test site inside the test sample at the center of the short-wavelength X-ray diffractometer circle

Method used

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  • Positioning method for short wavelength X-ray diffraction testing sample
  • Positioning method for short wavelength X-ray diffraction testing sample
  • Positioning method for short wavelength X-ray diffraction testing sample

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] like figure 2 As shown in the figure, the measured sample is a fine-grained steel sheet of 20mm*20mm*0.5mm, and the upper and lower thresholds of the X-ray detection and analysis system of the short-wavelength X-ray diffraction instrument are set, and WKα with a wavelength of 0.0209nm is used 1 Measure the diffraction intensity and diffraction spectrum, the tube pressure is 200kv, the tube flow is 8mA, the divergence angle of the incident collimator and the receiving collimator are both 0.11°, the Y-axis and Z-axis coordinates of the reference point are positioned by the laser, and the X-axis scan is used. Measure the distribution of the transmitted short-wavelength X-ray diffraction count intensity along the thickness direction, and accurately locate the X-axis coordinates of the reference point, as follows:

[0040] Step 1: Clamp the sample on the sample stage so that the surface normal of the test part selected as the reference point is parallel to the X-ray inciden...

Embodiment 2

[0047] like Figure 4 As shown, the measured sample is a titanium alloy double-layer curved hollow sample with a wall thickness of 2 mm. The upper and lower thresholds of the X-ray detection and analysis system of the short-wavelength X-ray diffraction instrument are set, and WKα with a wavelength of 0.0209 nm is used. 1 Measure the diffraction intensity and diffraction spectrum, the tube pressure is 200kv, the tube flow is 4mA, the divergence angle of the incident collimator and the receiving collimator are both 0.11°, the Y-axis and Z-axis coordinates of the reference point are positioned by the laser, and the X-axis scan is used. Measure the distribution of the transmitted short-wavelength X-ray diffraction count intensity along the thickness direction, and accurately locate the X-axis coordinates of the reference point, as follows:

[0048] Step 1: Clamp the sample on the sample stage so that the surface normal of the test site selected as the reference point is parallel t...

Embodiment 3

[0054] like Image 6 As shown, the tested samples are hollow titanium alloy samples with different wall thicknesses, one side wall thickness is 1mm thick, the other side wall thickness is 3mm maximum, and the minimum is 1mm thick serrated sample. The sample is a sealed structure, and it is difficult to directly observe the thickness of its interior. The divergence angles of the incident collimator and the receiving collimator of the short-wavelength X-ray diffraction instrument are both 0.11°. The upper and lower thresholds of the X-ray detection and analysis system of the instrument are set and WKα with a wavelength of 0.0209nm is used. 1 When measuring the diffraction intensity and diffraction spectrum, the tube pressure is 200kv, the tube flow is 4mA, and the Z-axis coordinate of the sample reference point is positioned by the laser; the transmitted X-ray intensity distribution of the vertically incident sample is measured by direct Y-axis scanning, and the Y of the sample ...

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Abstract

The invention provides a positioning method for a short wavelength X-ray diffraction testing sample. The positioning method comprises the following steps: fixedly mounting a testing sample on a sampleplatform of a short wavelength X-ray diffraction device; selecting one testing part of the testing sample as a reference point; acquiring a Y-axis coordinate YS, a Z-axis coordinate ZS and an X-axiscoordinate XS of the reference point of the testing sample through laser beam radiation or by using a method for testing transmission intensity distribution of X-rays penetrating through the referencepoint; and according to size coordinate relationships of coordinates XS, YS and ZS and the testing sample, calculating and confirming three-dimensional coordinates of other parts to be tested, of thetesting sample, and moving the X-axis, the Y-axis and the Z-axis of the sample platform to a calculated and confirmed coordinate of a part to be tested, thereby positioning the part to be tested, ofthe testing sample, in the center of a short wavelength X-ray diffractometer circle. By adopting the positioning method, positioning problems of testing parts inside a single-layer plate sample, a hollow equal-thickness sample and a hollow unequal wall thickness sample are solved, and precise positioning on testing parts of various testing samples can be achieved.

Description

technical field [0001] The invention relates to an X-ray diffraction detection technology, in particular to a positioning method of a short-wavelength X-ray diffraction test sample. Background technique [0002] Neutron diffraction technology, high-energy synchrotron radiation technology and short-wavelength X-ray diffraction technology can all be used to detect residual stress, texture and object equality inside the material workpiece. Among them, the short-wavelength X-ray diffraction technology is emitted by a heavy metal target X-ray tube. Strongly penetrating characteristic X-rays (such as WK α , UK α , WK β etc.), using the parallel optical path formed by the incident collimator and the receiving collimator (the intersection of the incident ray and the diffraction line is the spatial position of the sample test point, that is, the center of the short-wavelength X-ray diffractometer circle), non-destructively measuring the diffractometer circle The diffraction intens...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20G01N23/20008G01N23/20025
CPCG01N23/20G01N23/20008G01N23/20025
Inventor 窦世涛郑林肖勇张津何长光张伦武朱蕾彭正坤
Owner NO 59 RES INST OF CHINA ORDNANCE IND
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