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Method of testing resistance of circuit to side channel analysis

A testing method and circuit technology are applied in the fields of devices implementing encryption algorithms, circuits for processing secret data, software for encryption operations, circuits for transforming messages, circuits for hash functions, and hardware encryption components, which can solve side-channel test failures , unable to recover, etc.

Pending Publication Date: 2019-03-05
ESHARD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Notwithstanding the above, there are still cases where this time alignment cannot be recovered, such that the side-channel test will fail even if there is a secret data leak in the trace

Method used

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  • Method of testing resistance of circuit to side channel analysis
  • Method of testing resistance of circuit to side channel analysis
  • Method of testing resistance of circuit to side channel analysis

Examples

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Embodiment Construction

[0046] figure 1 An example of a secure integrated circuit CT is shown, for example arranged on a portable medium HD such as a plastic card or any other medium, or in a terminal such as a mobile terminal, smartphone, laptop, IoT device, etc. The integrated circuit of this example comprises a microprocessor PRC, an input / output circuit IOC, memories M1, M2, M3 coupled to the microprocessor via data and address buses, and optionally a cryptographic calculation coprocessor CP1 or an arithmetic accelerator, and the random number generator RGN. The memory M1 is a RAM type ("Random Access Memory") memory containing volatile application data. Memory M2 is a non-volatile memory, such as EEPROM or flash memory, containing non-volatile data and applications. The memory M3 is a read-only memory (or ROM memory) containing the operating system of the microprocessor.

[0047] The communication interface circuit IOC can be contact type, such as according to ISO / IEC 7816 standard; non-conta...

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PUM

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Abstract

The invention relates to a test method comprising: acquiring a plurality of value sets (Ci), each comprising values of a physical quantity or of logic signals, linked to the activity of a circuit to be tested when executing distinct cryptographic operations applied to the same secret data, for each value set, counting occurrence numbers of the values of the set, for each operation and each of thepossible values of a part of the secret data, computing a partial result of operation, computing sums of occurrence numbers, each sum being obtained by adding the occurrence numbers corresponding to the operations which when applied to the same possible value of the part of the secret data, provide a partial operation result having the same value, and analyzing the sums of occurrence numbers to determine the part of the secret data.

Description

technical field [0001] The present invention relates to a method for testing electrical circuits, in particular circuits designed to handle secret data, and in particular to a circuit for transforming messages by means of encryption algorithms using secret keys. [0002] The invention relates in particular to devices implementing cryptographic algorithms, such as secure devices (smart card integrated circuits, secure elements, secure memory cards), mobile devices (mobile phones, smartphones, devices for the Internet of Things - IoT), home automation and automotive devices , and hardware encryption components integrated into computer motherboards and other electronic and IT devices (USB drives, TV decoders, game consoles, etc.). The invention also relates to software including cryptographic operations, provided for execution in a secure or non-secure environment. [0003] The invention is particularly concerned with implementing encryption algorithms such as DES (Data Encrypti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L9/00H04L9/30G06F7/72
CPCG06F7/725H04L9/003H04L9/3066G06F2207/7261G01R31/31719G09C1/00H04L2209/12G06F21/75H04L9/002G06F7/723G06F21/556
Inventor B·菲克斯H·西博尔德德拉克鲁伊
Owner ESHARD