Ultrafast optical wavelength measuring system
A wavelength measurement, ultrafast light technology, applied in optical radiation measurement, measurement devices, measurement optics, etc., can solve the problem of bandwidth-limited photodetector bandwidth, etc., and achieve the effect of improving measurement accuracy and high-precision optical wavelength measurement
Active Publication Date: 2019-04-12
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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Although this method can guarantee real-time measurement, the bandwidth is limited by the bandwidth of the photodetector
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[0014] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the following further describes the present invention in detail in conjunction with specific embodiments and with reference to the accompanying drawings.
[0015] See figure 1 As shown, figure 1 It is a schematic structural diagram of an ultrafast optical wavelength measurement system according to an embodiment of the present invention. The system includes a narrow linewidth laser 1, first to fifth optical couplers 13-17, a mode-locked laser 2, first to fifth Photodetectors 3-7, a first analog-to-digital conversion module 8, a second analog-to-digital conversion module 9, a digital signal processing module 10, and a dispersion compensation fiber 11, wherein the output optical signal of the mode-locked laser 2 undergoes dispersion After the compensation fiber 11 is divided into three paths by the third optical coupler 15, the reference optical signal output by the narrow li...
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The invention discloses an ultrafast optical wavelength measuring system. The ultrafast optical wavelength measuring system comprises a narrow linewidth optical maser, a first optical coupler, a second optical coupler, a third optical coupler, a fourth optical coupler, a fifth optical coupler, a mode-locked optical maser, a first photoelectric detector, a second photoelectric detector, a third photoelectric detector, a fourth photoelectric detector, a fifth photoelectric detector, a first analog-digital conversion module, a second analog-digital conversion module, a digital signal processing module and a dispersion compensation fiber. According to the ultrafast optical wavelength measuring system, a wavelength of a measuring optical signal is obtained by processing an output wide spectrumoptical signal and a reference optical signal of the mode-locked optical maser and a beat frequency signal of an optical signal to be measured, and the measuring range is equal to the spectral width of the mode-locked optical maser, namely, 10-100nm magnitude. The measuring rate is equal to the pulse repetition frequency of the mode-locked optical maser and can reach 50 MHz. A cross-correlation algorithm is introduced in the digital signal processing module to improve the measurement accuracy, and the measurement accuracy is inversely proportional to the bandwidths of the photoelectric detectors multiplied by a dispersion coefficient of the dispersion compensation fiber, namely, 10pm magnitude. Therefore, the ultrafast optical wavelength measuring system can realize optical wavelength measurement with a large bandwidth, a high rate and high accuracy.
Description
Technical field [0001] The invention belongs to the technical field of microwave photonics and coherent optical signal processing, and specifically relates to an ultrafast optical wavelength measurement system. Background technique [0002] With the development of optoelectronic technology, ultra-fast measurement of light wavelength is very necessary, especially when analyzing a microwave photonics black box system, a spectrometer is often used to measure the light wavelength, but the measurement frequency of the spectrometer is extremely high. Low, on the order of 1 Hz, it is difficult to realize real-time optical wavelength analysis of optical signals. In many cases, the measurement optical signal is coupled to the same photodetector as a reference signal with a known optical wavelength, and then digital signal processing is performed on the output electrical signal to analyze the wavelength of the measurement optical signal. Although this method can guarantee real-time measur...
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Login to View More IPC IPC(8): G01J9/00
CPCG01J9/00
Inventor 李明肖晔孙术乾祝宁华
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI