Method and device for measuring complex magnetic permeability of sheet material

Abstract

Embodiments of the invention provide a method and a device for measuring the complex magnetic permeability of a sheet material. The method comprises the following steps: a first air region, a to-be-measured sample placing area and a second air area are sequentially arranged in a dielectric layer between a grounding plate of a microstrip line and a conduction band, and the to-be-measured sample placing area is filled with a to-be-measured thin film material; and characteristic impedance and propagation constants of two ports of the microstrip line are obtained on the basis of a transmission reflection method, relative dielectric constants of the two ports of the microstrip line are obtained on the basis of relations between electromagnetic parameters of the material and the characteristic impedance and between the electromagnetic parameters of the material and the propagation constants, and the complex magnetic conductivity of the to-be-measured thin film material is obtained on the basis of the relative dielectric constants. Based on the measurement of an S parameter after a sample is added in a broadband test process, the characteristic impedance of the microstrip line filled withthe to-be-measured thin film material is calculated by utilizing the transmission reflection method; the relative dielectric constants of the two ports of the microstrip line are calculated accordingto the relations between the electromagnetic parameters and the characteristic impedance; and then the complex magnetic conductivity in a test frequency band range is calculated. The method and the device have the characteristics of wide test frequency band, high repeatability, simple structure and the like.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of measurement and application of electromagnetic parameters of materials, in particular to a method and device for measuring complex magnetic permeability of sheet materials. Background technique [0002] With the rapid development of communication technology, microwave devices are developing in the direction of miniaturization, ultra-wideband, and low loss. Magnetic thin films are used more and more in electronic devices, such as thin film inductors, thin film sensors, thin film interference suppressors and high For the application of high-frequency magnetic devices such as density magnetic recording and reproducing heads, the premise of using these magnetic films is to accurately know the basic electromagnetic parameters of the magnetic materials used. Therefore, it is of great significance to be able to accurately measure the magnetic permeability of magnetic films under wide-screen ...

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Problems solved by technology

[0004] The embodiment of the present invention provides a method and device for measuring the complex magnetic permeability of thin sheet materials, which are used to solve the problems in the prior art of measuring the magnetic permeability of thin films, which are cumbersome and have relatively large measurement errors. Strong, simple structure and other characteristics

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