A phase microscopy imaging device and method based on structured light illumination

Abstract

The invention discloses a phase microimaging device and method based on structured light illumination. The device comprises an illumination module, a light beam modulation module and a differential interferometric imaging module, wherein the illumination module includes a light source and a first telescope unit, the light beam modulation module includes a polarizing film, a light beam digital modulation unit and a second telescope unit, and the light beam digital modulation unit is used for generating striated structured light with different angles and phases; and the differential interferometric module includes a third telescope unit and an imaging unit. Light emitted by the light source successively passes through the first telescope unit, the polarizing film, the light beam digital modulation unit, the second telescope unit and the third telescope unit, and is received by the imaging unit. According to the phase microimaging device and method based on structured light illumination,illuminating light with the striated structure is produced by the digital beam modulation unit, phase gradient distribution of a to-be-measured sample in the two orthogonal directions can be obtained,and phase distribution of the measured sample is quantitatively measured.

Description

technical field [0001] The invention belongs to the technical field of microscopic imaging, and in particular relates to a phase microscopic imaging device and method based on structured light illumination. Background technique [0002] Traditional optical microscopic imaging can only obtain the intensity information of the sample, but cannot directly image or measure the phase, and the phase distribution can often reflect the three-dimensional shape, internal structure and refractive index distribution of the object, so the phase distribution of the sample can be analyzed. Imaging techniques for visual or quantitative measurements are of great interest. [0003] In 1985, Xu Yuguang from the Shanghai Institute of Optics and Fine Mechanics of the Chinese Academy of Sciences proposed in the patent CN85105355 a phase-contrast microscopy device that uses a half-mirror to split the imaging object light into two beams and perform differential interference. In 2012, Zeng Shaoqun o...

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Problems solved by technology

Both of the above two devices form differential interference in one direction through refraction and light splitting. Although they can improve the imaging contrast of transparent samples, they cannot quantitatively reconstruct the phase distribution of the sample.

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