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A method for measuring wall heat flux based on cdte film

A heat flux density and measurement method technology, applied in the direction of material thermal development, material excitation analysis, fluorescence/phosphorescence, etc., can solve the problems of limited layout density, high frequency response, low frequency response of thermal resistance, etc., and achieve the sensitivity and accuracy of measurement Improved effect

Active Publication Date: 2020-03-31
XI AN JIAOTONG UNIV
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Considering that the frequency response of thermocouples and thermal resistances is low, and the arrangement density on the heat flow section is limited, it is difficult to further improve the spatial resolution of traditional heat flux measurement. This invention proposes a new optical measurement method of heat flux. The field interference is small, the frequency response is high, and the measurement response speed can theoretically reach femtoseconds (10 -12 ) level, and the measurement spatial resolution can reach micron level

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  • A method for measuring wall heat flux based on cdte film
  • A method for measuring wall heat flux based on cdte film
  • A method for measuring wall heat flux based on cdte film

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Embodiment 1

[0026] (1) if figure 1 As shown, the test piece 1 includes a first CdTe film 1-1, a first CdTe film 1-3, a tempered glass film 1-2 and a glass base 1-4. The production steps of test piece 1 are as follows: first, mix 1 g of gelatin with 6 g of water and heat, then drop 0.3 ml of water-soluble CdTe quantum dots into the gelatin solution, shake the mixed solution fully, and heat the mixed solution at 50°C for 15 minutes after shaking. The mixed solution is evenly spin-coated on the surface of the glass substrate 1-4 to prepare the second CdTe thin film 1-3.

[0027] (2) if figure 1 As shown, temperature calibration: the temperature controller 9 controls the heater 8 to heat the second CdTe film 1-3 to different temperatures, the ultraviolet light source 2 excites the second CdTe film 1-3 to emit fluorescence, and the second filter 4 is used The second high-speed camera 6 collects images of the second CdTe thin film 1-3 at different temperatures, and the luminous intensity of t...

Embodiment 2

[0034] (1) iffigure 1 As shown, the test piece 1 includes a first CdTe film 1-1, a second CdTe film 1-3, a tempered glass film 1-2 and a glass base 1-4. The production steps of test piece 1 are as follows: first, mix 2 g of gelatin with 16 g of water and heat, then drop 0.8 ml of water-soluble CdTe quantum dots into the gelatin solution, fully shake the mixed solution, and then heat the mixed solution at 70°C for 15 minutes at a constant temperature after shaking. The mixed solution is evenly spin-coated on the surface of the glass substrate 1-4 to prepare the second CdTe thin film 1-3.

[0035] (2) if figure 1 As shown, temperature calibration: the temperature controller 9 controls the heater 8 to heat the second CdTe film 1-3 to different temperatures, the ultraviolet light source 2 excites the second CdTe film 1-3 to emit fluorescence, and the second filter 4 is used The second high-speed camera 6 collects images of the second CdTe thin film 1-3 at different temperatures, ...

Embodiment 3

[0042] (1) if figure 1 As shown, the test piece 1 includes a first CdTe film 1-1, a second CdTe film 1-3, a tempered glass film 1-2 and a glass base 1-4. The production steps of test piece 1 are as follows: first, mix 1 g of gelatin with 10 g of water and heat it, then drop 0.5 ml of water-soluble CdTe quantum dots into the gelatin solution, shake the mixed solution fully, and heat the mixed solution at 90°C for 15 minutes after shaking. The mixed solution is evenly spin-coated on the surface of the glass substrate 1-4 to prepare the second CdTe thin film 1-3.

[0043] (2) if figure 1 As shown, temperature calibration: the temperature controller 9 controls the heater 8 to heat the second CdTe film 1-3 to different temperatures, the ultraviolet light source 2 excites the second CdTe film 1-3 to emit fluorescence, and the second filter 4 is used The second high-speed camera 6 collects images of the second CdTe thin film 1-3 at different temperatures, and the luminous intensity...

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Abstract

A CdTe thin film-based wall surface heat flux density measurement method comprises the following steps: firstly, preparing a measurement test piece containing two layers of CdTe thin films with different fluorescence emission wavelengths, and then calibrating the test piece to obtain peak wavelength-temperature calibration curve of the two layers of CdTe thin films respectively; placing the test piece on the wall surface to be measured, obtaining temperature fields of the two layers of CdTe films through high-speed camera shooting, image analysis and inversion calculation, and finally calculating the heat flux density field of the wall surface according to the Fourier heat conduction law. The field measurement of the heat flux density can be realized through the optical method, the measurement precision is high, the resolution is high, and the frequency response is fast.

Description

technical field [0001] The invention relates to the technical field of surface heat flux field testing, in particular to a method and system for measuring the heat flux field by using the spectral temperature change characteristics of quantum dots. Background technique [0002] Heat flux measurement has important and extensive applications in thermal stress analysis of solid parts, large-scale integrated circuit heat dissipation design, dynamic measurement of high-speed rotating parts and other fields. [0003] The main idea of ​​heat flux measurement is to arrange temperature sensing elements at different sections in the heat flow direction to measure the temperature, and then calculate the heat flux according to Fourier's heat conduction law. Among them, the temperature measurement on the section perpendicular to the heat flow direction is the core technology of heat flux density measurement. The existing technology mainly uses temperature sensing elements such as thermoc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/64G01N25/20
CPCG01N21/64G01N25/20
Inventor 牛照程张丹王珍珍王辉辉邓才智
Owner XI AN JIAOTONG UNIV
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