Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Automatic single particle irradiation test control system and method

A single-particle irradiation, test control technology, applied in general control systems, control/regulation systems, electronic circuit testing, etc., can solve problems such as not being clearly given, affecting circuit analysis, errors, etc., to improve machine time utilization efficiency, improve accuracy, and reduce workload

Active Publication Date: 2019-08-02
BEIJING MXTRONICS CORP +1
View PDF12 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the complexity of the accelerator debugging, many parameters are required for debugging, but the accelerator will provide the output of the irradiation parameters under the current conditions, such as the particle fluence rate; in the previous single particle irradiation test platform, the experimenter needs to observe the irradiation of the test with naked eyes Conditions start (end) the test process, so there will inevitably be large errors and delays, and the test variables of the chip under test (particle fluence rate, total particle fluence, chip Current, single event error number, test stimulus, test waveform) will affect the follow-up designer's analysis of the circuit being irradiated

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic single particle irradiation test control system and method
  • Automatic single particle irradiation test control system and method
  • Automatic single particle irradiation test control system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0073] Such as figure 2 As shown, a specific automated single particle irradiation test process is given, which specifically includes the following steps:

[0074] (1) The test circuit board, program-controlled power supply, signal generator and oscilloscope of the tested chip are built around the particle beam port into a single particle irradiation test platform. Each test instrument is connected and controlled through the network port.

[0075] (2) After the platform is built, set the threshold of the irradiation conditions. When the single event flip test of the trigger is performed, set the single event flip error number threshold of the trigger to 100, and the total fluence threshold of the particles 10 7 ions / cm 2 , As long as one of them is reached, it means that the irradiation conditions are met;

[0076] (3) The accelerator performs the adjustment and preparation of the single particle beam, and the system is connected to the fluence rate output interface of the acceler...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an automatic single particle irradiation test control system and method. The system comprises an experimental instrument program control module, a fluence rate monitoring module, an error number counting module and a timing detection module. According to the invention, the automatic opening and closing of the chip irradiation test are realized by presetting an irradiationcondition threshold value, the automation degree of the integrated circuit single particle irradiation test is effectively improved, and the waste of a single particle irradiation tester and the workload of an experimenter are reduced; and meanwhile, the generated data file contains all test data (particle fluence rate, total particle fluence, test current, single particle error number and test waveform), so that the single particle test accuracy is improved, and is beneficial to the subsequent personnel to analyze the test result.

Description

Technical field [0001] The invention relates to an automatic single particle irradiation test control system, belonging to the technical field of semiconductor integrated circuit anti-space single event effect verification. Background technique [0002] The domestic single-particle ground simulation verification of aerospace components requires the use of heavy ion accelerators. An irradiation test platform was built at the beam port provided by the accelerator to verify the chip's ability to resist single event effects. Due to the complexity of accelerator debugging, many parameters are required for debugging, but the accelerator will provide the output of irradiation parameters under current conditions, such as particle fluence rate; in the previous single particle irradiation test platform, the experimenter needs to observe the irradiation with naked eyes. The condition starts (ends) the test process, which will inevitably have large errors and delays, and the test variables ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G05B19/042G01R31/265G01R31/308
CPCG01R31/2656G01R31/308G05B19/0423G05B2219/25257
Inventor 毕潇郑宏超李哲杜守刚于春青赵旭穆里隆彭惠新徐雷霈张栩燊董方磊武永俊
Owner BEIJING MXTRONICS CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com