Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A dual-channel optical three-dimensional interference method and system based on underdetermined blind source separation

An underdetermined blind source separation, dual-channel technology, applied in the field of dual-channel optical three-dimensional interference method and system based on underdetermined blind source separation, can solve the problem of solving the source signal, unable to use the inverse matrix, etc.

Inactive Publication Date: 2021-02-09
GUANGDONG UNIV OF TECH
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the prior art, since the number of observation signals is less than the number of source signals, the source signal cannot be solved in the form of an inverse matrix; if the noise fluctuation is too strong and the amplitude of the interference signal is small, it is easy to make the two Closer interfering signals are aliased into one signal

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A dual-channel optical three-dimensional interference method and system based on underdetermined blind source separation
  • A dual-channel optical three-dimensional interference method and system based on underdetermined blind source separation
  • A dual-channel optical three-dimensional interference method and system based on underdetermined blind source separation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0084] The present invention will be further described in detail below in conjunction with the embodiments and the accompanying drawings, but the embodiments of the present invention are not limited thereto.

[0085] Described in this embodiment is a two-channel laser wavenumber scanning three-dimensional interferometry system, such as figure 1 As shown, the system mainly includes a semiconductor laser, a laser controller, a temperature control module, an optical wedge, a CCD camera, a beam splitter, a computer, a liquid crystal sheet, lens L1, lens L2 and slide glass.

[0086] The key device of the imaging optical path in this embodiment is a CCD camera, and the CCD camera is required to have a large dynamic range, high resolution and fast response speed. Since the slide-type test piece is greatly affected by the environment and temperature, the indoor temperature should be kept constant and stable during the experiment.

[0087] This embodiment provides a glass slide interfer...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a dual-channel optical three-dimensional interference method based on underdetermined blind source separation. Through the interference data collected by a CCD camera, the interference signals between the surfaces of the slide glass under test are blindly separated, and the parameters of the interference signals are solved, including : Interference signal amplitude frequency and interference signal phase frequency; based on the dual-channel optical three-dimensional Michelson interference experiment, the estimation of the mixing matrix is ​​obtained through the K-means clustering algorithm and the recovery of the source signal is realized through the L1 norm shortest path method; finally, the laser The wave number scanning accurately blindly separates the four-surface interference signals through the light intensity values ​​collected by the CCD camera, and realizes the blind separation of the four-surface interference signals; compared with the ordinary interferometric method that cannot accurately identify each peak position, the present invention uses a dual-channel Detection and sampling, through blind source separation, enables the signal to detect the location of each interference signal even in the face of relatively strong noise.

Description

technical field [0001] The invention relates to the technical field of two-channel laser wavenumber scanning three-dimensional Michelson interference, in particular to a two-channel optical three-dimensional interference method and system based on underdetermined blind source separation. Background technique [0002] Interference refers to the superposition of two columns of coherent waves that meet certain conditions. In the superposition area, the vibration at some points is always strengthened, and the vibration at some points is always weakened, that is, the vibration intensity has a stable spatial distribution in the interference area. In the measurement of various parameters, interferometry has high test sensitivity and accuracy, and is a high-precision measurement method. [0003] Blind source separation refers to recovering the source signal only based on the observed mixed signal under the condition that the source signal and the transmission channel process are unk...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
CPCG01B11/2441G01B9/02004G01B9/02084G01B9/02021G01B9/02028G01B9/02032G01B9/02055G01B9/02083G01B9/02044G01J3/2823
Inventor 周延周任燕
Owner GUANGDONG UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com