A wide temperature range low temperature environment test device

Abstract

The invention discloses a low-temperature environment test device with a wide temperature range, which relates to the field of low-temperature environment tests, and includes a thermal insulation cabin, a liquid nitrogen supply system, a gas nitrogen generation and pressure stabilization system, a heating system, a cooling system, and a high and low temperature circulation pipeline system , liquid accumulation prevention device and measurement control system, wherein the gas nitrogen generation and pressure stabilization system is composed of a liquid nitrogen vaporizer, a nitrogen pressure reducer, a nitrogen pipeline safety valve, and a nitrogen pipeline solenoid valve. The insulation cabin is divided into a static pressure chamber, Working space and circulating air duct, the heating system is composed of electric heater and solid state relay in the circulating air duct, the cooling system is composed of liquid nitrogen wall evaporator, liquid nitrogen secondary evaporator and liquid nitrogen evaporator in the circulating air duct, high and low temperature The circulation pipeline system connects the insulation cabin, liquid nitrogen supply system, gas nitrogen generation and pressure stabilization system, heating system, and cooling system to form a loop. The invention can realize the test temperature environment in the ultra-low temperature zone, has uniform temperature field, no liquid accumulation phenomenon, and is safe and reliable.

Description

technical field [0001] The invention relates to the field of low-temperature environment tests, in particular to a low-temperature environment test device with a wide temperature range. Background technique [0002] In the research and development process of important components such as aerospace equipment and precision electronic components, it is often necessary to provide a high and low temperature thermal environment to simulate the working environment of the components to test the function and performance of the components. Through searching the prior art, it is found that in CN200410078807.3, CN200910201130.0, CN201210424959.9 and CN201710043525.7 and other related patents that use non-mechanical refrigeration, the thermal test environment can usually only achieve a temperature range of -150°C and above. Limited by problems such as liquid nitrogen effusion and poor temperature field uniformity, it is usually difficult to achieve an ultra-low temperature range close to ...

AI Technical Summary

Problems solved by technology

Limited by problems such as liquid nitrogen effusion and poor temperature field uniformity, it is usually difficult to achieve an ultra-low temperature range close to the saturation temperature of liquid nitrogen (about -196°C)

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