Wafer thinning method and wafer structure
A wafer and wafer testing technology, which is applied to machine tools suitable for grinding workpiece planes, semiconductor/solid-state device testing/measurement, manufacturing tools, etc., can solve wafer undercutting, reduce effective chip area, and wafer price Advanced problems, to achieve the effect of reducing the number of edge trimming, increasing the effective chip area, and avoiding lateral undercutting
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0041] In order to make the above objects, features, and advantages of the present invention, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0042] Many specific details are set forth in the following description to fully understand the present invention, but the present invention can also be implemented in other than other means described herein, and those skilled in the art can do without violating the connotation of the present invention. Similarly, the present invention is not limited by the specific embodiments disclosed below.
[0043] Next, the present invention is described in connection with the schematic diagram. The scope of the invention is protected. In addition, the three-dimensional spatial dimensions of length, width, and depth should be included in the actual production.
[0044] As described in the background, after the wafer bond, it can be thinned from the back surface of the wa...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com