High overload test device and method of inertial device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HARBIN INST OF TECH
- Publication Date
- 2019-11-12
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Abstract
Description
technical field
[0001] The invention relates to a high overload testing device and method for inertial devices, belonging to the field of ground testing of inertial devices. Background technique
[0002] Typical high-overload tests include precision centrifuge tests and low-frequency line shaking table tests in laboratory environments, as well as vehicle-mounted, airborne and rocket sled tests that simulate the environment in which inertial instruments are used. Among these test methods, the centrifuge with an inverted platform (also known as a double-axis centrifuge) can provide a large overload constant value or harmonic linear acceleration reference input for the instrument under test, and has become the most accurate test method for gyro accelerometers and flexible accelerometers. and an important means of performance evaluation. The low-frequency linear vibration table can provide low-frequency and large-overload sinusoidal acceleration input for the inertial instrumen...