High overload test device and method of inertial device

An inertial device and testing device technology, applied in the field of inertial device high overload testing devices, can solve problems such as insufficient error excitation and inability to achieve high overload testing and the like
CN110440829AActive Publication Date: 2019-11-12HARBIN INST OF TECH

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
HARBIN INST OF TECH
Publication Date
2019-11-12

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
Patent Text Reader

Abstract

The invention provides a high overload test device and method of an inertial device, belonging to the field of ground tests of inertial devices. In the high overload test device, a parachute bin, a master test bin, and a secondary bin are installed in a bomb body, the parachute bin, the master test bin and the secondary bin in a test bomb are connected in sequence, adjustable external wings are installed outside the bomb body, a parachute is stored in the parachute bin, a highly precise test combined controller is installed in the master test bin, a to-be-tested inertial measurement unit is installed in the secondary bin, a fort is installed on the ground, the fort and a port controller are connected through a cable, a shell is installed on the fort, and a matchbox and the test bomb are installed in the shell. The high overload test device and method of the inertial device realize high overload, have a long error excitation effective test range, and promote implementation of projects.The device and method adopt a simple principle, are low in cost, promote implementation of projects easily, enable multiple effective test ranges in each test, and have high test efficiency.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to a high overload testing device and method for inertial devices, belonging to the field of ground testing of inertial devices. Background technique

[0002] Typical high-overload tests include precision centrifuge tests and low-frequency line shaking table tests in laboratory environments, as well as vehicle-mounted, airborne and rocket sled tests that simulate the environment in which inertial instruments are used. Among these test methods, the centrifuge with an inverted platform (also known as a double-axis centrifuge) can provide a large overload constant value or harmonic linear acceleration reference input for the instrument under test, and has become the most accurate test method for gyro accelerometers and flexible accelerometers. and an important means of performance evaluation. The low-frequency linear vibration table can provide low-frequency and large-overload sinusoidal acceleration input for the inertial instrumen...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More