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High overload test device and method of inertial device

An inertial device and testing device technology, applied in the field of inertial device high overload testing devices, can solve problems such as insufficient error excitation and inability to achieve high overload testing and the like

Active Publication Date: 2019-11-12
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Chinese Patent No. CN201020181149.1 titled "A MEMS Gyro Test System for a Dual-Axis Turntable" discloses a MEMS gyro test system for a dual-axis turntable. Combined to form a fully automatic MEMS gyro comprehensive test system, the temperature box provides temperature environment conditions for the MEMS gyro test, so that the MEMS gyro can be calibrated at various temperatures to increase the accuracy of its calibration, thus solving the problem of MEMS The high speed and test temperature control requirements required by the gyro test have improved the test efficiency; the test device and method based on the test device and method represented by the patent No. Overload test, error excitation is not enough, practical application still has certain limitations

Method used

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Embodiment 1

[0030] Embodiment one: if figure 1 As shown, a high overload test device for inertial devices involved in this embodiment includes a turret, a shell, a turret controller, a matchbox, and a test bomb. The test bomb includes a parachute compartment, a main test compartment, an auxiliary compartment, a projectile body and an outer The parachute chamber, the main test chamber and the auxiliary chamber are installed in the projectile body. The parachute chamber, the main test chamber and the auxiliary chamber in the test projectile are connected in sequence. , the main test compartment is equipped with a high-precision test combination and controller, and the inertial group to be tested is installed in the auxiliary compartment; the fort is installed on the ground, the fort and the fort controller are connected by cables, the shells are installed on the fort, the matchbox and the test The ammunition is installed in the shell.

[0031] The material of the projectile body is titaniu...

Embodiment 2

[0034] Embodiment two: if figure 1 As shown, a high overload test method for inertial devices involved in this embodiment, the specific steps are:

[0035] 1. Test preparation process:

[0036] According to the requirements of the test indicators, calculate the required gun barrel, gun barrel angle of attack and gunpowder volume, then install the gun barrel and powder box of the corresponding specifications, install the inertial group to be tested in the auxiliary chamber of the test bomb, and send the main gun according to the calculated data. The controller of the test chamber sets the command to open the parachute, put the test bomb into the barrel, adjust the angle of attack of the barrel through the fort controller and start the system;

[0037] 2. Measurement process:

[0038] The gunpowder box ignites and explodes, and the high-pressure gas pushes the test bomb forward along the gun barrel, lifts into the air, and begins to land after reaching the highest point. After...

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Abstract

The invention provides a high overload test device and method of an inertial device, belonging to the field of ground tests of inertial devices. In the high overload test device, a parachute bin, a master test bin, and a secondary bin are installed in a bomb body, the parachute bin, the master test bin and the secondary bin in a test bomb are connected in sequence, adjustable external wings are installed outside the bomb body, a parachute is stored in the parachute bin, a highly precise test combined controller is installed in the master test bin, a to-be-tested inertial measurement unit is installed in the secondary bin, a fort is installed on the ground, the fort and a port controller are connected through a cable, a shell is installed on the fort, and a matchbox and the test bomb are installed in the shell. The high overload test device and method of the inertial device realize high overload, have a long error excitation effective test range, and promote implementation of projects.The device and method adopt a simple principle, are low in cost, promote implementation of projects easily, enable multiple effective test ranges in each test, and have high test efficiency.

Description

technical field [0001] The invention relates to a high overload testing device and method for inertial devices, belonging to the field of ground testing of inertial devices. Background technique [0002] Typical high-overload tests include precision centrifuge tests and low-frequency line shaking table tests in laboratory environments, as well as vehicle-mounted, airborne and rocket sled tests that simulate the environment in which inertial instruments are used. Among these test methods, the centrifuge with an inverted platform (also known as a double-axis centrifuge) can provide a large overload constant value or harmonic linear acceleration reference input for the instrument under test, and has become the most accurate test method for gyro accelerometers and flexible accelerometers. and an important means of performance evaluation. The low-frequency linear vibration table can provide low-frequency and large-overload sinusoidal acceleration input for the inertial instrumen...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
CPCG01C25/005
Inventor 李莉夏红伟安昊王常虹马广程钟超
Owner HARBIN INST OF TECH
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