Super-resolution Bessel micro-imaging device and method based on multi-focus light illumination

Abstract

The invention provides a super-resolution Bessel micro-imaging device and method based on multi-focus light illumination. The method comprises a laser light source, a beam-expanding collimating and reflecting component, a Gaussian fluorescence generation component which excites a sample surface to generate a Gaussian-distributed fluorescence signal according to an introduced illumination mode of equal interval switching, a Bessel fluorescence generation component which converts the Gaussian-distributed fluorescence signal into a Bessel-distributed fluorescence signal and obtains image data, and a control terminal which performs image reconstruction on image data to obtain a super-resolution sample two-dimensional information image. According to the invention, a sample is simultaneously excited through multiple focus points, the imaging range of the microscopic imaging device is improved, the sample collection time is reduced, the Gaussian-distributed fluorescence signal is converted into the Bessel-distributed fluorescence signal, the image data of the collected Bessel-distributed fluorescence signal is subjected to image reconstruction, and the super-resolution imaging at a largeworking distance can be achieved while the high signal-to-noise ratio is improved.

Description

technical field [0001] The invention belongs to the field of optical microscopy technology, and in particular relates to a super-resolution Bessel microscopic imaging device and method based on multi-focus light illumination. Background technique [0002] Laser scanning confocal microscopy is an effective technical means to study biological microstructure, and it is widely used in the field of biomedicine. In the confocal microscope system, through a pair of conjugated precision pinholes and a single focal point razor scanning method, the system can suppress stray light from the non-focus plane, filter out information outside the focal plane, and obtain high Image contrast. Although confocal microscopy can achieve super-resolution imaging, its resolution is affected by the size of the pinhole. The smaller the pinhole, the higher the resolution. However, the signal light that can be collected is weaker, which directly leads to the improvement of resolution Reduce the signal...

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Problems solved by technology

[0005] In view of the deficiencies in the above-mentioned prior art, the object of the present invention is to provide a super-resolution Bessel microscopic imaging device and method based on multi-focus light illumination, which overcomes the problem of improving the resolution of the laser scanning confocal microscope in the prior art. It will reduce the signal-to-noise ratio of the sample image, the image scanning microscope cannot obtain consistent resolution, and the defect of the low signal-to-noise ratio of the Bessel microscope system under wide-field illumination is due to the side lobe of the Bessel spot

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