The present invention discloses a reflection-type non-metallic
material defect detection and
component analysis device and method. The device includes a linearly frequency modulated source module, a
solid-state
switch matrix, a low-
noise amplifier module group, a terahertz
signal transceiver device, an intermediate-frequency
signal acquisition module, and a host computer that are connected in sequence. The terahertz
signal transceiver device includes a first split-type terahertz signal
transceiver integrated
link group, a second split-type terahertz signal transceiver integrated
link group, a first pair of terahertz antennas, a first transparent non-polarizing
beam splitter, a first multi-focus parabolic mirror, a second pair of terahertz antennas, a second transparent non-polarizing
beam splitter, a second multi-focus parabolic mirror, as well as a
beam splitter, a third multi-focus parabolic mirror, and a four-dimensional scanning frame. The device and method disclosed by the present invention can achieve three-dimensional
tomography imaging with a micron-level resolution and
component analysis with a
hertz-level resolution for a sample to be measured, and at the same time have advantages such as a
large dynamic range and good environmental adaptability.