Packaging method for improving circuit yield of FOPLP chip
A packaging method and chip technology, applied in the direction of circuits, electrical components, electrical solid devices, etc., can solve the problems that the charge density of charged metals cannot meet the requirements of chip current density, large substrate area, etc., and achieve high electrification efficiency, good quality, The effect of increasing the charge density
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0054] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.
[0055] Such as figure 1 with figure 2 Shown, the encapsulation method that improves FOPLP chip circuit yield rate of the present invention may further comprise the steps:
[0056] S1: Provide a carrier board 1 , paste a temporary bonding glue 2 on the upper surface of the carrier board 1 . Wherein, the material of the substrate 1 can be glass, SUS, Prepreg (BT), FR4, FR5, P.P, EMC, or PI.
[0057] S2: Place the metal frame 3 on a designated place around the periphery of the carrier board 1 , and press the metal frame 3 on the temporary bonding glue 2 . Wherein, the material of the metal frame 3 is Cu, Ag, or Ti.
[0058] S3: Die-up attaching the multiple f...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


