Method for diagnosing traction rectifier IGBT open-circuit fault in CRH3 high-speed train

Abstract

The present invention provides a method for diagnosing a traction rectifier IGBT (Insulated Gate Bipolar Transistor) open-circuit fault in the CRH3 high-speed train, and belongs to the field of rectifier fault diagnosis. The method for improving the spectral kurtosis is used; the algorithm for improving the spectral kurtosis is simple, and the sudden change of energy in the signal and the corresponding frequency position can be detected; the degrees of the sudden change in the improvement of the spectral kurtosis under different faults are different; and when an open-circuit fault of a single-tube or a double-tube occurs, by using the method provided by the present invention, the fault occurrence can be quickly diagnosed, and the position of the fault tube can be precisely positioned. Themethod provided by the present invention is used for rectifier IGBT open-circuit fault diagnosis, fault occurrence can be quickly and accurately detected, and the fault type can be distinguished; andthe algorithm involved is simple, and without a large amount of data for training and testing, precise positioning of all fault types of the single-tube and double-tube of the rectifier IGBT can be realized.

Description

technical field [0001] The invention belongs to the field of fault diagnosis of rectifiers, in particular to a diagnosis method for IGBT open-circuit faults of traction rectifiers of CRH3 train sets. Background technique [0002] In recent years, with the rapid development of high-speed EMUs in my country, the traction drive system, as the driving force of EMUs, has a complex operating environment, which makes the failure probability of traction converters higher, and the failure rate of power device IGBT exceeds 60%. figure 1 It is the topological structure diagram of CRH3 EMU traction rectifier; the IGBT short-circuit fault is usually handled by hardware circuit due to the extremely short time, while the IGBT open-circuit fault has no obvious characteristics, and it is impossible to quickly diagnose and locate the fault location, thus expanding the impact of the fault. At present, the research on the open-circuit fault of IGBT is mainly focused on the inverter, relatively ...

AI Technical Summary

Problems solved by technology

[0003] For the open-circuit fault of the rectifier IGBT, the currently adopted method is the fault diagnosis method related to signal analysis. The analysis methods based on the current signal mainly include wavelet analysis, Fourier transform, etc. to preprocess the original signal, and then combine the classifier to classify the fault. It requires more data, complex algorithms, and more time-consuming; the analysis method based on voltage signals requires new hardware circuits, and the operation is complicated

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