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Method for measuring and calculating dispersity of load type metal catalyst based on atomic resolution electron microscope

A metal-loaded, dispersity technology, applied in material analysis using radiation, material analysis using radiation diffraction, etc., can solve the problem of lack of catalyst dispersion measurement method, etc.

Active Publication Date: 2020-01-17
DALIAN JIAOTONG UNIVERSITY
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Problems solved by technology

[0004] According to the above-mentioned problem that the existing technology lacks a method for measuring the dispersion degree of catalyst technology at the atomic scale, a method for measuring the dispersion degree of supported metal catalysts based on atomic resolution electron microscopy is provided

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  • Method for measuring and calculating dispersity of load type metal catalyst based on atomic resolution electron microscope
  • Method for measuring and calculating dispersity of load type metal catalyst based on atomic resolution electron microscope
  • Method for measuring and calculating dispersity of load type metal catalyst based on atomic resolution electron microscope

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Embodiment 1

[0053] like figure 1 As shown, the present invention provides a method for measuring the dispersion degree of metal atoms of a supported catalyst by utilizing electron microscope characterization, image program identification and information statistics, which specifically includes the following steps:

[0054] (1) Use a transmission electron microscope (TEM) to obtain pictures of the metal catalyst; before using the transmission electron microscope, select the parameters of the scanning transmission electron beam (STEM-HAADF) and set the parameters of the imaging sensor: the parameters of the scanning transmission electron beam include the acceleration voltage , aperture size and camera constant, etc.; the parameters of the imaging sensor include signal gain, signal baseline compensation and image contrast display mode, etc.;

[0055] (2) Metal particle identification processing, followed by top hat transformation, frequency domain method to filter out the base, image sharpeni...

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Abstract

The invention provides a method for measuring and calculating the dispersity of a load type metal catalyst based on an atomic resolution electron microscope. The method specifically comprises the following steps: (1) acquiring a picture of the metal catalyst by adopting a transmission electron microscope; (2) identifying metal particles by carrying out hat transformation, substrate filtering by afrequency domain method, image sharpening, dynamic threshold binarization and target region marking sequentially; and (3) calculating the dispersity, by identifying metal particles in all pictures according to the step 2), obtaining a single-point graph and a cluster graph for each picture, calculating the dispersity according to picture information provided by the single-point graph and the cluster graph, and fitting dispersity into a function. The picture information comprises the number of metal particles, distribution positions of the metal particles, the number of clusters, the area of clusters and the area of part with a substrate of an image. The method of the invention can solve the problem that the prior art lacks a method to calculating and measuring the dispersity aimed at the catalyst in the atomic scale.

Description

technical field [0001] The invention relates to the field of atomic dispersion degree measurement, in particular, to a method for measurement and calculation of the dispersion degree of a supported metal catalyst based on atomic resolution electron microscopy. Background technique [0002] The dispersity information, such as the density, distance, and adjacent coordination relationship of metal atoms in supported metal catalysts, is very important to the performance of catalysts, which is directly related to the activity, selectivity and stability of catalysts. Methods to determine the atomic dispersion of metals in supported catalysts have been widely discussed in academia and industry. [0003] There are X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), transmission electron microscopy (TEM), chemical adsorption method, etc. for the determination of metal atomic dispersion of supported catalysts. Among them, in recent years, with the atomic resolution capab...

Claims

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Application Information

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IPC IPC(8): G01N23/04G01N23/20
CPCG01N23/04G01N23/20
Inventor 刘淑慧刘伟
Owner DALIAN JIAOTONG UNIVERSITY
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