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an ion source

An ion source and the same technology, applied in the field of ion sources, can solve the problems of reducing the sensitivity of mass spectrometers and reducing the collection efficiency of charged particles 140'

Active Publication Date: 2022-03-18
宁波谱秀医疗设备有限责任公司
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  • Claims
  • Application Information

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Problems solved by technology

However, due to the relationship between the scattering angle and the momentum of the scattered charged particles 140′ after the collision, when moving along the electric field, a part will hit the outer surface of the tip of the skimmer electrode 540, and cannot enter the skimmer electrode 540, resulting in The collection efficiency of charged particles 140' is reduced, thereby reducing the sensitivity of the mass spectrometer

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Embodiment Construction

[0014] The implementation of this application will be described in detail below through examples, so that the implementation process of how this application applies technical means to solve technical problems and achieve technical effects can be fully understood and implemented accordingly.

[0015] figure 2 It is the schematic diagram of the ion source of the embodiment of the present invention. The ion source includes a sample inlet 21 , an arc-shaped mesh electrode 22 , a spherical collision surface 23 , a skimmer 24 and a plurality of annular thin-film electrodes 25 on the inner wall of the skimmer 24 . The sample inlet 21, the arc-shaped mesh electrode 22, the spherical collision surface 23, the skimmer 24 and a plurality of annular thin-film electrodes 25 are located on the same axis, as figure 2 Shown by the dotted line AA' in. The spherical collision surface 23 and the skimmer 24 are made of insulating dielectric material. The center O of the arc-shaped mesh elect...

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Abstract

The invention provides an ion source, which comprises a sample inlet (21), an arc-shaped mesh electrode (22), a spherical collision surface (23), a skimmer (24) and a skimmer located on the same axis (24) a plurality of annular thin film electrodes (25) on the inner wall; Between the annular film electrodes (25) at the entrance of the tip of the device (24), the radius (r) of the arc-shaped mesh electrode (22) is much larger than the inner cavity diameter (Φ) of the skimmer (24). The ion source can improve the ion collection efficiency, thereby improving the sensitivity of the mass spectrometer.

Description

technical field [0001] The invention relates to the technical field of mass spectrometry, in particular to an ion source. Background technique [0002] Mass spectrometry (Mass Spectrometry, MS) is a method of analyzing and detecting ions using the charge-to-mass ratio. The analysis and detection process is that first, the sample molecules are ionized by the ion source to generate gas-phase ions, and then the mass analyzer analyzes and detects the gas-phase ions based on the charge-to-mass ratio. Through the analysis and detection of gas-phase ions, structural information such as the molecular weight, chemical structure, and cracking laws of the sample can be obtained. How to ionize macromolecules such as oligosaccharides, proteins, and nucleic acids that exist in aerosol or liquid phase, and then realize the detection and analysis of these macromolecules, has always been a focus of attention in the industry and academia. [0003] An existing ion source suitable for the ion...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/10
CPCH01J49/10
Inventor 吴宝昕
Owner 宁波谱秀医疗设备有限责任公司