High-reflection object measurement method and system based on laser speckle limit constraint projection
A limit-constrained, laser speckle technology, applied in measurement devices, optical devices, instruments, etc., can solve the problems of complex measurement systems, inability to measure three-dimensional objects with high reflection, and difficult to achieve, so as to reduce the impact and improve the accuracy of three-dimensional measurement. , the effect of simple structure
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[0020] Such as figure 1 As shown in , this method of measuring highly reflective objects based on laser speckle limit-constrained projection includes the following steps:
[0021] (1) Based on the principle of camera pinhole imaging, construct a mathematical model of the camera, and use mathematical software to calculate the internal and external parameters of the camera;
[0022] (2) Project stripe-shaped speckle on the surface of the highly reflective object in the direction of the camera baseline, the translation stage drives the highly reflective object to move, and the camera collects multiple sets of pictures;
[0023] (3) Utilize the camera parameters obtained in step (1) to calibrate, and use the Fusiello limit correction method to correct the pictures collected in step (2);
[0024] (4) Use compiling software and image processing library to carry out stereo matching to a group of pictures after step (2) limit correction, use gray scale area correlation algorithm, ask...
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