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Novel multi-wavelength phase microscopic imaging method based on F-P cavity

A phase microscopic and multi-wavelength technology, which is applied in phase influence characteristic measurement, instruments, and measuring devices, can solve complex problems, achieve high resolution, improve measurement accuracy, and reduce noise

Inactive Publication Date: 2020-04-10
GUILIN UNIV OF ELECTRONIC TECH
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Problems solved by technology

[0012] Patent CN201710904860.1 discloses an optical coherence tomography imaging system, which uses Mach-Zehnder interference optical path, which is characterized by the use of optical fibers to simplify the system and reduce costs, but compared with the optical path structure of the F-P cavity, it is still relatively complex

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  • Novel multi-wavelength phase microscopic imaging method based on F-P cavity
  • Novel multi-wavelength phase microscopic imaging method based on F-P cavity
  • Novel multi-wavelength phase microscopic imaging method based on F-P cavity

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Embodiment 1

[0064] Figure 2b An embodiment of digital holographic recording optical path based on F-P cavity is given. The optical path includes wavelengths respectively λ 1 ,λ 2 ,λ 3 Three light sources 21-1, 21-2, 21-3, mirror 23-1, beam splitter 22-2, 22-3, attenuator 23, beam expander 24, F-P etalon 25, sample to be tested 26, microscope objective lens 27, CCD28 and computer 29. The three light beams start from the light source, pass through the mirror beam splitter, and then reach the attenuator 23, where the energy of the beam is weakened, and the beam passes through the beam expander 24, and the diameter of the beam is enlarged, and the beams of different wavelengths pass through the F-P standard with the sample 26 to be tested respectively. When the tool is 25, the F-P etalon 25 is reflected multiple times, and passes through the sample 26 to be tested multiple times. After each beam of transmitted light passing through the F-P etalon 25 passes through the microscope objectiv...

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Abstract

The invention provides a novel multi-wavelength phase microscopic imaging method based on an F-P cavity. The method is characterized by comprising the steps of F-P cavity-based multi-wavelength digital hologram recording, numerical reconstruction, unwrapping, error processing, three-dimensional phase distribution reconstruction and three-dimensional refractive index conversion. The invention mainly provides a novel multi-wavelength phase microscopic imaging method based on an F-P cavity, and the method is higher in sensitivity compared with a conventional microscopic imaging method. The mehtodhas the advantages of being simple in structure, high in sensitivity and accurate in measurement. The method can be used for high-resolution three-dimensional microscopic imaging of an optical transparent object, and can be widely applied to lossless, unmarked and non-contact three-dimensional tomography and the like of tiny organisms.

Description

[0001] (1) Technical field [0002] The invention relates to a new method of multi-wavelength phase microscopic imaging based on F-P cavity, which can be used for high-resolution three-dimensional microscopic imaging of optically transparent objects, and can be widely used in the non-destructive, label-free and non-contact imaging of tiny organisms. Three-dimensional tomography and the like belong to the technical field of microscopic imaging. [0003] (2) Background technology [0004] The three-dimensional refractive index distribution of the sample to be tested is an important inherent property. For the optically transparent sample to be tested, the three-dimensional refractive index distribution can reflect the microstructure, density and other information of the sample. Labeled, non-contact 3D tomography. [0005] In contemporary life science research, fluorescence imaging is usually used to label the samples to be tested. However, in the process of marking, it will have...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/45
CPCG01N21/453G01N2021/4173
Inventor 苑立波孟令知李晟
Owner GUILIN UNIV OF ELECTRONIC TECH
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