High-precision hybrid integrated circuit test frame isolation protection structure

Abstract

The invention discloses a high-precision hybrid integrated circuit test frame isolation protection structure, which relates to the technical field of circuit test auxiliary structures. The high-precision hybrid integrated circuit test frame isolation protection structure integrates a single-chip microcomputer, a test chip, a relay, an isolation optocoupler and a Handle interface on a circuit substrate, realizes short circuit detection between a test frame power supply and the ground and isolation between the test frame power supply and a to-be-tested chip power supply by utilizing the optocoupler, can prevent the chip from being damaged by hot plugging, facilitates the installation and improves the use efficiency, isolates all analog power supplies and digital power supplies as well as analog grounds and digital grounds by means of the optocoupler, suppresses common-mode interference, avoids common-mode interference generated during integrated design, ensures system signal stability and normal overall operation, reduces the system size, decreases the cost, improves the efficiency, can measure whether the power supply of the chip and the ground are short-circuited or not, and isolates the power supply and an instruction signal by adopting the optocoupler, so that crosstalk is prevented.

Description

technical field [0001] The invention relates to the technical field of circuit test auxiliary structures, in particular to an isolation and protection structure for a high-precision hybrid integrated circuit test frame. Background technique [0002] Integrated circuit testing is the electrical characteristic measurement and service condition test for the chip under test that must be completed after the integrated circuit is manufactured and before it is delivered to the customer. [0003] Integrated circuit testing is the process of detecting integrated circuits or modules, by measuring the output response of integrated circuits and comparing the expected output, to determine or evaluate the function and performance of integrated circuit components. It is to verify design, monitor production, ensure quality, analyze Invalidation and an important means of guiding application. [0004] Abnormal states of integrated circuits include defects, faults, and failures. Due to poor ...

AI Technical Summary

Problems solved by technology

[0008] In order to protect the chip under test, it is generally necessary to install a switch for the power supply of the test chip to prevent the chip from being damaged by hot plugging during the test process of this kind of integrated circuit test stand, which is very inefficient to use; if the signal source adopts a standard signal generator, the cost High and inconvenient to install. In the integrated design, the system signal is often unstable due to common-mode interference and cannot work normally; the signal output by the test stand needs to be connected to the Handle. Since the two power supply voltages are different, in order to prevent interference, a relay is generally added for isolation , high cost, large volume, low efficiency

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