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Medium-wave infrared Fourier transform imaging spectrometer athermalization secondary imaging system

An infrared Fourier transform and secondary imaging technology, which is applied in the field of spectral imaging, can solve problems such as lack of spectral information, poor heat dissipation, and environmental temperature effects, and achieve the effects of improving signal-to-noise ratio, good imaging quality, and low processing cost

Active Publication Date: 2020-04-28
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The present invention solves the problem that the existing secondary imaging system is affected by the ambient temperature, difficult to install and calibrate, lack of map information caused by low illumination at the edge of the image plane, and the inability to obtain full-frame clear images caused by the system depth of field being smaller than the total height of the stepped micro-mirror. Problem: Provide a kind of mid-wave infrared Fourier transform imaging spectrometer athermal difference secondary imaging system

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  • Medium-wave infrared Fourier transform imaging spectrometer athermalization secondary imaging system
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specific Embodiment approach 1

[0027] Specific implementation mode 1. Combination Figure 1 to Figure 9 Describe this embodiment, the optical passive athermal difference secondary imaging system of the medium-wave infrared Fourier transform imaging spectrometer, its working band is 3-5 μm; Surface) 1, beam splitter 2, compensation plate 3, first lens 4, second lens 5, third lens 6, fourth lens 7, fifth lens 8, detector window 9, detector cold stop 10 and Detector front (image plane) 11.

[0028] The incident light passes through the stepped micro-mirror 1, passes through the beam splitter 2 and the compensation plate 3, then passes through the first lens 4, the second lens 5, the third lens 6, the fourth lens 7 and the fifth lens 8, and then passes through the detector The window 9 and the detector cold stop 10 are finally imaged on the detector array (image plane) 11 .

[0029] In this embodiment, the beam splitter 2 and the compensating plate 3 are both flat plates made of zinc selenide, the first lens ...

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Abstract

A medium-wave infrared Fourier transform imaging spectrometer athermalization secondary imaging system relates to the technical field of spectral imaging, solves defects of an athermalization technology of an existing infrared optical system, and comprises a stepped micro-reflector, a beam splitter, a compensation plate, five lenses, a detector window, a detector cold diaphragm and a detector array plane. By solving a focal power distribution equation, a system out-of-focus equation caused by a lens refractive index change and a material thermal expansion and lens cone thermal expansion equation, three materials of chalcogenide glass, germanium and silicon are mutually combined to realize a passive athermalization function. According to the system, the passive athermalization function is realized in a temperature range of-20 DEG C to 60 DEG C, relative illuminance of an edge of an image surface is close to 90%, a distortion amount is less than 0.4%, a transmission function value at 171p / mm is close to a diffraction limit, a depth of field of the system meets a total height of a stepped mirror, and a design result shows that a maximum change rate of a MTF value of the system does not exceed 1% when imaging is performed by taking different stepped height positions on an object plane. The system realizes 100% matching of a cold diaphragm without vignetting.

Description

technical field [0001] The invention relates to the technical field of spectral imaging, in particular to a space-time combined modulation type Fourier transform imaging spectrometer athermal difference secondary imaging system working in mid-wave infrared and based on stepped micro-reflectors. Background technique [0002] The vast majority of VOCs gases have obvious characteristic absorption peaks in the mid-wave infrared spectrum. Spectral analysis of them by spectroscopic instruments can quickly identify the type and concentration of pollutants and other information. Compared with prism and grating spectrometer, the Fourier transform imaging spectrometer has the advantage that the detection spectrum can cover the middle and far infrared bands. However, due to the particularity of infrared materials, temperature changes will change the refractive index of materials, the radius and thickness of optical elements, and the spacing between optical elements, resulting in therma...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G01N21/3504G02B27/00
CPCG01N21/01G01N21/3504G01N2021/0112G01N2021/3595G02B27/0025
Inventor 吕金光任俊梁静秋王惟彪秦余欣陶金赵百轩
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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