An Athermal Relay Imaging System for Long-Wave Infrared Fourier Transform Imaging Spectrometer

A technology of Fourier transform and imaging spectrometer, which is applied in the direction of interference spectroscopy, color/spectral characteristic measurement, instruments, etc., can solve the problems of long-wave band optical passive athermalization, etc., achieve low processing cost, easy access, and improve signal quality The effect of the noise ratio

Active Publication Date: 2021-10-08
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The present invention provides a long-wave infrared Fourier transform imaging spectrometer adiabatic relay imaging system to solve the special design requirements proposed by the optical imaging system based on the stepped mirror and the long-wave band optical passive athermal difference.

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  • An Athermal Relay Imaging System for Long-Wave Infrared Fourier Transform Imaging Spectrometer

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specific Embodiment approach 1

[0028] Specific implementation mode 1. Combination Figure 1 to Figure 9 Describe this embodiment, a long-wave infrared Fourier transform imaging spectrometer athermal difference relay imaging system, the imaging system uses a refraction-diffraction hybrid lens to achieve athermal difference, and realizes passive The adiabatic function adopts the object-space telecentric optical path, which matches the front telephoto system. The relative illuminance at the edge of the image plane is close to 85%, the distortion is less than 0.4%, the passivation value at 17lp / mm is close to the diffraction limit, and the depth of field of the system meets the total height of the stepped micro-mirror. , the maximum change rate of the system MTF value does not exceed 1.5%. The system achieves 100% cold stop matching without vignetting.

[0029] Ladder micromirror (object plane) 1, beam splitter 2, compensation plate 3, first lens 4, second lens 5, third lens 6, fourth lens 7 arranged in seque...

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Abstract

A long-wave infrared Fourier transform imaging spectrometer athermal aberration relay imaging system relates to the technical field of spectral imaging and solves the deficiencies of the existing long-wave infrared optical system athermal aberration technology. The front surface of the first lens is a cylindrical mirror, and the third The second lens is a refractive-diffractive hybrid lens, the front surface is a binary plane, the rear surface of the fifth lens is an even-order aspherical surface, and the beam splitter and the compensation plate are both parallel flat plates. The beam splitter and the compensation plate are made of zinc selenide, the first lens is a positive diopter convex lens, the material is zinc selenide, the second lens is a positive diopter convex lens, the material is germanium, the third lens and the fifth lens are both The positive diopter convex lens is made of zinc selenide, and the fourth lens is a negative diopter concave lens. The relative illuminance at the edge of the image plane is greater than 85%, the distortion value is less than 0.4%, the transmission value at 17lp / mm is close to the diffraction limit, and the depth of field of the system meets the total height of the stepped micromirror. The maximum change rate of the system MTF value does not exceed 1.5%.

Description

technical field [0001] The invention relates to an optical passive athermal difference relay imaging system working in long-wave infrared and applied to a time-space joint modulation type Fourier transform imaging spectrometer based on stepped microreflectors. Background technique [0002] The optical passive athermalization method does not introduce additional mechanical structures. It only needs to combine different optical materials and use the difference in chromatic aberration coefficient and thermal difference coefficient to achieve complementarity. Passive athermalization can be realized. It has simple structure, low weight Light and other advantages. Therefore, most infrared optical systems choose this method to achieve athermalization. However, this method requires at least three kinds of materials to be combined with each other, and the long-wave infrared materials are limited by the level of domestic material preparation, and there are fewer types of materials th...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45G01N21/35G01N21/01G01N25/20G02B1/00G02B13/00G02B13/14G02B13/18G02B13/22
CPCG01J3/45G01N21/01G01N21/35G01N25/20G01N2021/0112G02B1/00G02B13/0045G02B13/0055G02B13/008G02B13/14G02B13/18G02B13/22
Inventor 梁静秋任俊吕金光王惟彪秦余欣陶金赵百轩
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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