High-low temperature box integrated cabinet test system

Abstract

The invention belongs to the technical field of test equipment, and particularly relates to a high-low temperature box integrated cabinet test system. The high-low temperature box integrated cabinet test system comprises at least one test chamber, an equipment chamber, an electric box, a control panel and an energy feedback type power supply module, wherein the control panel, the electric box andthe equipment chamber are respectively arranged on the right side of the at least one test chamber; the energy feedback type power supply module is mounted on the rear side of the at least one test chamber; a wind wheel, a heating plate and an evaporator are respectively arranged in the at least one test chamber; a compressor and a condenser are respectively arranged in the equipment chamber; a controller is arranged in the electric box; the wind wheel is connected with a motor outside the box body; the motor, the compressor, the condenser, the heating plate and the evaporator are respectivelyconnected with the controller; and the controller is connected with the control panel. The integrated cabinet test system manufactured by combining the energy feedback type power supply and the high-low temperature box saves space, reduces the time cost and the economic cost, reduces heat emission and improves the reliability.

Description

technical field [0001] The invention relates to the technical field of test equipment, in particular to a test system and method for a high and low temperature box integrated cabinet. Background technique [0002] With the improvement of quality requirements for industrial products, the products produced need to undergo simulation tests before they are put into the market, and the tests are required to completely and truly simulate the real situation of the products during use. High and low temperature test chambers are widely used in chemistry, biology, physics and other fields. sex meet the requirements. [0003] The test chambers of the high and low temperature test chambers in the prior art are all single-chamber tests, resulting in uneven contact of the sample with the wind flow during the test, and the different positions of the sample have different effects on the environment, resulting in test data errors; in addition, the existing The sample is loaded on the tray,...

AI Technical Summary

Problems solved by technology

[0003] The test chambers of the high and low temperature test chambers in the prior art are all single-chamber tests, resulting in uneven contact of the sample with the wind flow during the test, and the different positions of the sample have different effects on the environment, resulting in test data errors; in addition, the existing The sample is loaded on the tray, and the surface of the sample contacting the tray cannot be in good contact with the environment, which will affect the test results; and the existing high and low temperature test chambers do not properly discharge the condensed water generated by the condenser, which affects the life of the test equipment

[0004] At the same time, the output load of the existing domestic and foreign power module test devices adopts two modes: 1. Directly use resistance as the load. It is very inconvenient to replace different load resistances for different output specifications, and the output power is all converted into heat. Consumption; 2. Consumable electronic loads can be programmed to adapt to different output specifications, but all output power is still converted into heat consumption

The energy conversion efficiency of the power module itself is above 80%. It can be seen that the main power consumption during the test is converted into heat and wasted in vain. At the same time, due to the large heat generation, it will in turn affect the ambient temperature and affect the reliability and accuracy of the test results.

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