An electro-optical sampling measurement waveform correction method and system

Abstract

The invention relates to an electro-optic sampling measurement waveform correction method and system, the method comprising: determining the mathematical model of the EOS system measurement waveform; using a Gaussian function to fit the main signal and the reflected signal in the EOS system measurement waveform; Combined with the Gaussian function fitting process, the curve that is closest to the actual measured waveform of the EOS system is fitted, and the optimal control parameters of the measured waveform of the EOS system are obtained; the reflected signal is reconstructed using the optimal control parameters, and measured from the EOS system The reconstructed reflection signal is subtracted from the waveform to obtain the corrected EOS system measurement waveform. The technical solution provided by the present invention scientifically and rationally corrects the overlap and superposition problem of the main signal waveform and the reflected signal waveform in the measurement waveform by constructing the reflection signal waveform, and effectively restores the measured main signal waveform from the actual measurement waveform of the EOS system, effectively The problem of measurement waveform distortion is solved, and then the metrological traceability of high-speed pulse waveform parameters generated by PD is realized.

Description

technical field [0001] The invention relates to the technical field of electro-optic sampling, in particular to an electro-optical sampling measurement waveform correction method and system. Background technique [0002] With the development of high-speed computing and wireless broadband communication, time-domain broadband measurement technology has been widely used in baseband and RF field signal testing and product development, and the bandwidth of broadband sampling oscilloscopes has gradually increased from 50GHz to 100GHz. Due to the limitations of the measurement principle of the "Nose-to-nose" (NTN) calibration technology, it can no longer meet the demand for traceability of the broadband sampling oscilloscope. With the advancement of high-speed pulse generation technology using photoelectric means, international advanced metrology laboratories (NIST in the United States, PTB in Germany, NPL in the United Kingdom, etc.) have gradually returned to the technical route ...

AI Technical Summary

Problems solved by technology

The impact of factors such as impedance mismatch and multiple reflections of sampling light will cause distortion of the time-domain measurement waveform, and the distorted waveform will not be used to characterize the system function of the PD under test, and cannot effectively reflect the rise time of the PD under test. And bandwidth and other parameter indicators, and then it cannot be used as a traceability standard for the transient response parameters of broadband sampling oscilloscopes

[0005] For the EOS measurement system, the impact of impedance mismatch and multiple reflections of sampling light on the measurement results is the inherent uncertainty introduction component of the EOS technology itself. The uncertainty can be reduced to a certain extent by improving the CPW processing technology and adjusting the optical path. Degree component, but limited improvement and high cost

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