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Rapid detection method for trace elements in wheat flour based on hyperspectral imaging

A technology of hyperspectral imaging and wheat flour, applied in the direction of color/spectral characteristic measurement, measurement device, test sample preparation, etc., to achieve the effect of low cost, high efficiency and simple operation

Inactive Publication Date: 2020-07-10
CHINA AGRI UNIV
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  • Claims
  • Application Information

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Problems solved by technology

However, there is no precedent for using hyperspectral imaging technology for the prediction of trace elements in wheat flour

Method used

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  • Rapid detection method for trace elements in wheat flour based on hyperspectral imaging
  • Rapid detection method for trace elements in wheat flour based on hyperspectral imaging
  • Rapid detection method for trace elements in wheat flour based on hyperspectral imaging

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Embodiment 1

[0037] Example 1. Rapid non-destructive detection method for trace elements in wheat flour based on hyperspectral imaging

[0038] 1. Collect samples

[0039] Wheat flour samples were collected from Wuqiao Experimental Station of China Agricultural University from 2017 to 2019. This experiment included 13 wheat varieties, namely Beijing No. 8, Fengkang No. 8, Gaoyou 2018, Gaoyou 5766, Hanmai 15, Jing 411, Jimai 22, Nongda 139, Nongda 399, Shimai 22, and Zhongmai. 1062, Zhongmai 175 and Zhongmai 578. After the wheat matured, a total of 631 wheat grain samples were collected in this experiment; the grains were threshed, washed 5 times with deionized water, dried at 70°C to constant weight, and ground into flour samples using a ball mill and a zirconia grinding jar.

[0040] 2. Grain hyperspectral image acquisition

[0041] (1) Build a hyperspectral imaging system, such as figure 1 shown. The hyperspectral imaging system of the present invention includes a hyperspectral imag...

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Abstract

The invention discloses a method and a system for rapid nondestructive detection of trace elements in wheat flour based on hyperspectral imaging, and particularly relates to the technical field of nondestructive detection of wheat flour quality. The method comprises the following steps: collecting a test sample, acquiring data, processing the data and constructing a model. The hyperspectral imaging technology overcomes the defects of time consumption and labor consumption of the traditional determination method, and realizes the rapid detection of the trace element content of the wheat flour.The method can be used for quickly grading and screening the nutritional quality of the wheat flour and provides a new choice for online detection of wheat flour production.

Description

technical field [0001] The invention relates to the technical field of wheat flour quality detection, in particular to a method for rapid detection of trace elements in wheat flour based on hyperspectral imaging. Background technique [0002] The human body needs the participation of nutrients to maintain normal metabolism, these nutrients include water, carbohydrates, 9 kinds of essential amino acids, 2 kinds of fatty acids, 7 kinds of macronutrients, 16 kinds of trace elements and 13 kinds of vitamins, etc., lack of any of these nutrients , will lead to metabolic disorders, thereby affecting the health of the human body. The main nutrients lacking in the diet of Chinese residents are trace elements, among which calcium is the most obvious lack of nutrients. The lack of micronutrients will lead to a high incidence of various chronic diseases such as obesity, hypertension, diabetes, cardiovascular disease, and osteoporosis. At the same time, with the improvement of living ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31G01N21/3563G01N21/359G01N21/73G01N1/28G01N1/44G06F30/20
CPCG01N1/28G01N1/44G01N21/314G01N21/3563G01N21/359G01N21/73G01N2021/3155
Inventor 王志敏胡乃月张英华李伟于康孙振才杜承航张震高艳梅刘影
Owner CHINA AGRI UNIV
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