A Test Platform Compatible with Various Switches
A test platform and switch technology, applied in machine learning, computer components, knowledge-based computer systems, etc., can solve problems such as waste of area, difficult recovery of test data, inconvenient switch test, etc., to improve data security performance Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment (1
[0062] Embodiment (1) system
[0063] As shown in the figure, a test platform compatible with various switches, wherein the platform includes:
[0064] The device layer is provided with different types of switches and switch detection equipment, and the data set types detected by the switch detection equipment include at least the object characteristic test data, function test data, performance test data, management test data or reliability test of the switch data, wherein the functional test data at least includes throughput test data, transmission delay test data, packet loss rate test data or back-to-back test data; wherein the switch detection device is provided with more than two compatible communication interfaces, the The communication interface is at least RS232 communication channel interface, RS485 communication channel interface, carrier communication channel interface, TCP / IP communication channel interface, RS422 communication channel interface, Ethernet communica...
Embodiment (2
[0069] Embodiment (2) method
[0070] A method for implementing a test on a test platform compatible with multiple switches, comprising the following steps:
[0071] (S1) Generate data; test switches through various switch detection devices in the device layer, use compatible communication interfaces to test various parameters of different types of switches, and clean and sample the generated switch data to output pure data Information, realize the storage of switch data information;
[0072] (S2) Data storage: realize the storage of object characteristic test data, function test data, performance test data, management test data or reliability test data of the switch through the storage unit in the cloud processor, and realize the sharing of various test data;
[0073] (S3) Data calculation: Calculate, process and classify the received switch data information by the calculation unit, then use the data mining calculation module to classify and calculate the stored switch data ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com