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Defect identification method and device and electronic equipment

A defect identification and defect-free technology, applied in measuring devices, optical test defects/defects, image data processing, etc., can solve the problems of missed detection and untimely detection, achieve outstanding features, easy identification, improve efficiency and accuracy Effect

Active Publication Date: 2020-09-01
创新奇智(上海)科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the embodiment of the present application is to provide a defect identification method, device and electronic equipment to solve the problem of missed inspection or untimely detection through human observation when traditional looms weave

Method used

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  • Defect identification method and device and electronic equipment
  • Defect identification method and device and electronic equipment
  • Defect identification method and device and electronic equipment

Examples

Experimental program
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Effect test

no. 1 example

[0039] Such as figure 1 As shown, the embodiment of the present application provides a defect identification method, the defect identification method is used to automatically detect the defects of the weaving, specifically including the cracks of the weaving, the entanglement of the weaving thread, and the defects of the weaving. Automatic detection of defects such as breakage of weaving threads, this method can be applied to terminal equipment such as servers and computers, and may specifically include the following steps:

[0040] Step S100: Obtain the image of the fabric to be identified.

[0041] Step S102: Input the image of the to-be-recognized fabric into a preset non-defective model to obtain a defect-free weaving image corresponding to the weaving image to be recognized output by the preset non-defective model.

[0042] Step S104: Generate a difference image according to the weaving image to be recognized and the corresponding non-defective weaving image.

[0043] S...

no. 2 example

[0086] Figure 11 A schematic structural block diagram of the defect identification device provided by the present application is shown, and it should be understood that the device is different from the above-mentioned Figure 1 to Figure 10 Corresponding to the embodiment of the method executed in the first embodiment, the steps involved in the method executed by the server in the first embodiment can be executed. For the specific functions of the device, refer to the above description. To avoid repetition, the detailed description is appropriately omitted here. The device includes at least one software function module that can be stored in a memory in the form of software or firmware (firmware) or solidified in an operating system (operating system, OS) of the device. Specifically, the device includes: an acquisition module 200, configured to acquire an image of the fabric to be identified; an input module 201, configured to input the image of the fabric to be identified int...

no. 3 example

[0094] Such as Figure 12As shown, the present application provides an electronic device 3, including: a processor 301 and a memory 302, the processor 301 and the memory 302 are interconnected and communicate with each other through a communication bus 303 and / or other forms of connection mechanisms (not shown), The memory 302 stores a computer program executable by the processor 301. When the computing device is running, the processor 301 executes the computer program, so as to execute the first embodiment and any optional implementation manner of the first embodiment. Method, such as step S100 to step S106: obtain the image of the fabric to be identified; input the image of the fabric to be identified into the preset non-defective model to obtain the corresponding A non-defective weaving image; generating a difference image according to the weaving image to be recognized and the corresponding non-defective weaving image; identifying the difference image to obtain the defect ...

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PUM

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Abstract

The invention provides a defect identification method and device, and electronic equipment. The method comprises the steps of obtaining a to-be-identified woven fabric image; inputting the to-be-identified woven fabric image into a preset defect-free model to obtain a defect-free woven fabric image corresponding to the to-be-identified woven fabric image output by the preset defect-free model; generating a distinguishing image according to the to-be-identified woven fabric image and the corresponding defect-free woven fabric image, wherein the distinguishing image represents the difference between the to-be-identified woven fabric image and the corresponding defect-free woven fabric image; and identifying the distinguishing image to obtain a defect type corresponding to the to-be-identified woven fabric image.

Description

technical field [0001] The present application relates to the technical field of artificial intelligence, in particular, to a defect identification method, device and electronic equipment. Background technique [0002] When traditional looms weave, human inspection is generally used to check whether there are defects in the production process, but this method is prone to missed inspections or untimely inspections. Contents of the invention [0003] The purpose of the embodiments of the present application is to provide a defect identification method, device and electronic equipment to solve the problem of missed detection or untimely detection through human observation when traditional looms weave. [0004] In the first aspect, an embodiment of the present invention provides a method for identifying defects, the method comprising: acquiring an image of a fabric to be identified; inputting the image of a fabric to be identified into a preset non-defective model to obtain th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T5/00G01N21/88
CPCG06T7/001G01N21/8851G01N2021/8887G06T2207/20081G06T2207/30124G06T5/70Y02P90/30
Inventor 张发恩徐国晟贲圣兰
Owner 创新奇智(上海)科技有限公司