Method for analyzing contents of main elements in low-silicon ferrosilicon by X-ray fluorescence spectrum

Abstract

The invention relates to a method for analyzing contents of main elements in low-silicon ferrosilicon by X-ray fluorescence spectrum. The method comprises the following steps: step one, respectively preparing standard samples with chemical method fixed values into standard sample sheets for analysis of an X-ray fluorescence spectrometer by a tabletting method, and establishing a standard curve bytaking the chemical method values as standard values; step two, respectively scanning the standard samples by using the X-ray fluorescence spectrometer, and establishing basic analysis conditions; step three, respectively measuring a standard sample wafer by using the X-ray fluorescence spectrometer according to basic analysis conditions, adding correction, carrying out fitting, and regenerating astandard curve; step four, preparing a sample to be detected into a sample wafer to be detected, which can be analyzed by the X-ray fluorescence spectrometer, by using a tabletting method; and step five, Then use the X-ray fluorescence spectrometer to analyzing the X-ray fluorescence spectrum of the sample to be detected by using the X-ray fluorescence spectrometer. According to the invention, the sample preparation is performed by using the ultra-high pressure tabletting method, such that the sample preparation time is short; the binder does not need to be added; the one-time molding is achieved; the analysis efficiency can be significantly improved; and the analysis result accuracy is high.

Description

technical field [0001] The invention belongs to the field of analysis methods, in particular to a method for analyzing the content of main elements in low-silicon ferrosilicon by X-ray fluorescence spectroscopy. Background technique [0002] Ferrosilicon is an important raw material for steelmaking, and its chemical composition detection is one of the important links to ensure steelmaking process control and quality control. Due to the large fluctuations in the composition of low-silicon ferrosilicon, it can be used instead of scrap steel in the steelmaking process without affecting the smelting composition. The silicon content of its main element is about 10%-20%, and the silicon content in conventional ferrosilicon products is about 70%. Affected by the sample's own matrix, it is different from the conventional ferrosilicon method. [0003] At present, the national standard methods for determining the silicon content in ferrosilicon are perchloric acid dehydration gravim...

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Problems solved by technology

However, during the implementation of these methods, there is a problem that reducing substances such as metals in the material react with the platinum crucible at high temperature, corrode the platinum crucible, and cannot achieve the repeated use of high-life experimental vessels.

Even if there is a protective step of using lithium tetraborate to hang on the wall in these methods, the platinum crucible still has a one-time use situation, and the price of the platinum crucible is relatively expensive. The serious corrosion of the platinum crucible causes the interruption of the experimental operation, and the materials used for the preparation of the sample are re-prepared. Increase the repetitive process, which virtually increases the cost of inspection and testing

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