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System and method for measuring interface microscopic interaction force under micron scale

A technology of interaction force and measurement system, applied in the field of micro-nano measurement and interface micro-interaction force, can solve the problems of lack of general applicability and lack of micro-scale micro-probe system measurement, and achieve the effect of universality

Active Publication Date: 2020-11-03
HEFEI UNIV OF TECH
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Problems solved by technology

[0003] At present, the research on the interface microscopic interaction force mainly revolves around the atomic force microscope (AFM). However, the radius of curvature of the probe tip of the AFM mostly ranges from a few nanometers to tens of nanometers, and the size of the interface microscopic interaction force ranges from nN to The pN level, the action area is within tens of nanometers, which can only explain the composition and mechanism of the microscopic interaction force of the probe microsphere at the interface at the nanometer scale, and most of the force measurement experiments using the atomic force microscope are only in a single effect. factor, it is not universally applicable, and there is a lack of measurement of the microscopic interaction force of the interface by the micron-scale microprobe system

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  • System and method for measuring interface microscopic interaction force under micron scale
  • System and method for measuring interface microscopic interaction force under micron scale
  • System and method for measuring interface microscopic interaction force under micron scale

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Embodiment Construction

[0049] In this example, in order to study the interface microscopic interaction force between the probe microsphere and the surface of the micro device at the micron scale, the influence of different influencing factors on the force is studied, so as to establish the curve between the interface microscopic interaction force and the separation distance The model proposes a measurement system for measuring the interface microcosmic interaction force under micron-scale probe microspheres. It is based on the design of fiber Bragg grating micro-nano sensing structure, which can create an error compensation mechanism and correct and optimize the micro-nano measurement system. , play a key role in reducing false triggering and jumping and trapping phenomena of the measurement system, improving measurement accuracy, reducing force measurement, and improving the reliability of the probe system. Improving the triggering and scanning accuracy of micro-nano probes provides a high-precision...

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Abstract

The invention discloses a measurement system and a measurement method for achieving interface microcosmic interaction force mechanism research under a micron scale, and the system comprises a sensingmodule, an optical sensing module, a demodulation optical path module, a signal conditioning module, an upper computer module, and a nano-scale precision micro-displacement driving module. According to the system, the measurement of the interface microscopic interaction force in the micron scale can be realized, so that the nanoscale sensitivity, resolution, larger linear measurement range and better stability are obtained; through the measurement system, measurement and research on the interface microscopic interaction force under the micron scale are realized, a force displacement curve of the microsphere head under the micron scale is obtained, and related action mechanisms and rules of the interface microscopic interaction force under the micron scale are disclosed; therefore, a theoretical basis and a technical guarantee are provided for improving the triggering and scanning precision of the micro-nano probe.

Description

technical field [0001] The invention relates to micro-nano measurement and interface micro-interaction force, more specifically, an interface micro-interaction force measurement system based on fiber Bragg grating micro-nano sensing measurement and a measurement method thereof. Background technique [0002] Micro-nano ultra-precision detection technology is an important guarantee for micro-device processing and assembly. Three-coordinate measuring machines are often used to precisely measure the three-dimensional dimensions of some micro-devices. In order to measure various micro-devices, a variety of micro-probes and nano-scale precision measurement systems with various sensing principles have been developed. However, when the diameter of the probe microsphere reaches the order of microns or even nanometers, the magnitude of the interface microscopic interaction force between the probe tip and the surface to be measured will be much larger than gravity, which occupies a dom...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01L1/24
CPCG01L1/246
Inventor 刘芳芳杨子涵林芳慧赵荣敏夏豪杰李红莉陈丽娟
Owner HEFEI UNIV OF TECH
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