Embedded power distribution monitoring device

Abstract

The invention provides an embedded power distribution monitoring device, which is characterized in that a clock output circuit and an address generation circuit are arranged in a logic control module,the clock output circuit controls the address generation circuit to generate an address control signal, and if data is stored in a high-speed memory, the address of the high-speed memory is generatedby the address generation circuit; and if a DSP chip reads the data of the high-speed memory, the high-speed memory is connected to the DSP chip through an address bus, and the DSP chip reads the data according to the address mapping information, so that a hardware circuit can be used for controlling signal acquisition and storage, the acquisition is not limited by the instruction period of an MCU chip, and the function of completing acquisition of transient signals is realized.

Description

technical field [0001] The invention relates to the field of power quality detection, in particular to an embedded-based power distribution monitoring device. Background technique [0002] With the development of the national economy and industrial technology, although the degree of electrification of the society has increased significantly, the widespread use of high-power electrical equipment and nonlinear power electronic devices has produced problems such as harmonics, three-phase unbalance, voltage fluctuations, flicker, Voltage transients, voltage swells and dips, etc. These electrical problems will not only affect the stable economic operation of the power system, but also damage electrical devices, disrupt social production, and cause a large amount of economic losses. In the power distribution monitoring system, the grid transient is an evaluation index that cannot be ignored, and the detection of the grid transient is very necessary. [0003] The commonly used wa...

AI Technical Summary

Problems solved by technology

[0003] The commonly used wavelet transform technology measures transients, but it cannot measure distortion. Currently, state triggers are generally used to measure transient voltages. However, because the power grid transient pulse width is generally 1-20μS, the amplitude can be as high as 2500V. The frequency of the voltage is very high, often reaching the level of MHz, and the peak value of the voltage is also very high. For the transient, there are many parameters including the peak value and the rate of rise. Generally speaking, the ordinary data acquisition system cannot complete the detection of the transient Therefore, the requirements for detection technology are high. For example, when the pulse width is as short as 1μS, the detection equipment is required to be able to sample transient pulses in time and store them.

[0004] At present, there are mainly two schemes for completing the measurement of high-speed transient signals. One is to use an acquisition card based on the PCI bus design. The attenuation cannot be controlled; the other is the acquisition instrument controlled by MCU. Although there will be no problems in signal transmission, in this sampling device, all data reading and storage, A / D converter The control of the MCU will be restricted by the addressing time and instruction running time of the MCU. For the high-speed transient signal with a very fast changing speed and a very short changing process, this addressing speed cannot meet the requirements.

Moreover, due to the limitation of the execution time of MCU instructions, for example, a certain unit of data stored in RAM needs MCU to issue a write instruction, and the time will be limited by the main frequency of MCU, often resulting in the previous signal data not being stored yet, and the next signal data already being stored. The situation after harvesting

Images