Turning temperature measurement system based on microstructure optical fiber sensing
A micro-structured optical fiber and temperature measurement technology, which is applied in the direction of measurement/indicating equipment, metal processing equipment, metal processing machinery parts, etc., can solve the problems of being easily disturbed by chips and the external environment, and poor temperature measurement accuracy, so as to increase the temperature The effect of measurement accuracy, stable structure and strong practicability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0029] The invention provides a turning temperature measurement system based on microstructure optical fiber sensing, such as figure 1 and figure 2 As shown, it includes a tool 1, a tool bar 2, an optical fiber holder 3, a conductive optical fiber 4, a microstructure optical fiber probe 5, a turning workpiece 6, a first plano-convex lens 7, a beam splitter 8, a first filter 9, a second filter ...
PUM
Property | Measurement | Unit |
---|---|---|
Diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com