An Online Experiment Test System for Total Dose Effect of Scalable Microcontroller

Abstract

The present invention relates to an expandable micro-controller total dose effect online experimental test system, the online test system includes a test sub-board, a signal control arbitration motherboard, an expandable quick-connect socket, a serial bus, a TTL to 485 communication module and Host computer; the test sub-board is connected to the signal arbitration motherboard through an expandable quick-connect socket, and can simultaneously perform the total dose effect test of multiple microcontrollers under test; the signal controls the standby of the arbitration motherboard and the microcontroller under test The I / O ports are connected to each other, and the closed-loop communication between the microcontroller under test and the serial bus is established in turn by means of arbitration communication. The serial sending end and receiving end of each test sub-board are respectively connected to two serial buses; the serial bus Connect with TTL to 485 communication module. The on-line experimental test system provided by the invention can optimize the wiring and compatibility problems in the large-sample-volume test, and meet the rapid test needs of a large number of samples in the comparative screening of the total dose effect of various types of micro-controllers.

Description

technical field [0001] The invention belongs to the technical field of nuclear technology application, and in particular relates to an expandable micro-controller total dose effect online experimental testing system. Background technique [0002] When a silicon semiconductor integrated chip is irradiated by ionizing radiation, it will produce a total dose damage effect, forming an oxide layer inside the chip to fix trap charges and Si-SiO2 interface state trap charges, and the macroscopic manifestations are threshold voltage drift, leakage current increase and other electrical performance parameters. degradation or even functional failure. Since the total dose effect is closely related to the bias state of the chip, in order to accurately characterize the total dose damage of the chip in the actual operating state, on-line testing is currently the mainstream test method in the experimental research of the total dose effect. The online test method needs to build a targeted o...

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Problems solved by technology

Microcontrollers have complex internal structures and rich functions, and different manufacturers and different models of microcontrollers have different chip packages and functions; Limitations, such as the number and length of through cables, experiment cycle and frequency, etc.

[0004] In the screening experiment of the total dose effect of microcontrollers, it is usually necessary to carry out a large number of experimental tests for microcontrollers with various process feature sizes, multiple manufacturers, various types, and different batches, which will cause the experimental wiring space to be limited. Limitation, increased difficulty of wiring, incompatibility of the microcontroller under test, etc.; therefore, the design of the online test system is required to take into account versatility and integration as much as possible, so as to be suitable for comparative screening tests of various types of microcontrollers, and improve Experimental efficiency for large sample size testing

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