Method and device for establishing near-surface stratum quality factor model
A technology of formation quality factor and quality factor, applied in measuring devices, seismology, geophysical measurement, etc., can solve the problem of low lateral accuracy of formation quality factor, difficulty in micro-logging drilling, and poor economic benefits of deep-well micro-logging technology And other issues
Pending Publication Date: 2021-02-26
BC P INC CHINA NAT PETROLEUM CORP +1
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[0003] At present, the near-surface formation quality factor is mainly calculated by using the direct wave surface absorption and attenuation investigation data of field micro-logging. The horizontal accuracy of the formation quality factor is not high, and the lateral variation cannot be described in more detail; on the other hand, due to the limitation of the drilling depth of the micro-logging, the formation calculated by using the direct wave surface absorption and attenuation investigation data is relatively shallow, and the micro-logging removal technology for deep wells is economical. In addition to the poor efficiency, it is difficult for the cartridge or geophone to go into the well, and it is difficult to control the depth of the cartridge or geophone
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[0055] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.
[0056] Those skilled in the art should understand that the embodiments of the present invention may be provided as methods, systems, or computer program products. Accordingly, the present invention can take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermor...
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The invention provides a method and a device for establishing a near-surface quality factor model. The method comprises the following steps of: acquiring refracted wave seismic records, refraction first arrival time and refraction layering data of a small refraction and seismic production record single shot; determining a refracted wave analysis time window and a corresponding relation between first arrival refraction layering and a receiving channel according to the refracted wave seismic records, the refraction first arrival time and the refraction layering data; carrying out Morlet waveletmatching pursuit and Wigner-Ville joint time-frequency analysis on each channel of first arrival refracted wave in the analysis time window to obtain a time-frequency spectrum of each channel of firstarrival refracted wave; and establishing a whole-region near-surface stratum quality factor model according to the time-frequency spectrum of each first arrival refracted wave and the corresponding relationship between the first arrival refraction layering and the receiving channel. The method and the device are easy to implement in the field, low in cost and high in transverse survey point density, and the obtained stratum quality factor is high in transverse precision and has higher time and frequency resolution.
Description
technical field [0001] The invention relates to the technical field of petroleum seismic exploration, in particular to a method and device for establishing a near-surface quality factor model. Background technique [0002] In land seismic exploration, the loose surface medium has a strong absorption and attenuation effect on high-frequency components of seismic waves, resulting in a decrease in the vertical resolution of seismic data. Due to the lateral variation of surface lithology, velocity, and thickness, the degree of absorption and attenuation will be different, resulting in inconsistencies in energy, frequency, and phase between seismic channels, which will affect the lateral resolution of in-phase stacking results. Generally, the quality factor Q is used to describe this near-surface absorption Therefore, it is particularly important to accurately establish a near-surface quality factor model, which can also be called a near-surface attenuation model. [0003] At pr...
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IPC IPC(8): G01V1/50
CPCG01V1/50G01V2210/6169
Inventor 王瑞贞张学银崔宏良袁胜辉李海东王金宽
Owner BC P INC CHINA NAT PETROLEUM CORP