Measuring device and method capable of dynamically measuring surface shape of planar optical element
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
- Publication Date
- 2021-03-16
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the field of optics, and relates to a device and a method for measuring the surface shape of a plane optical element, in particular to a device and a method for dynamically measuring the surface shape of a plane optical element. Background technique
[0002] As the construction scale of high-power laser devices becomes larger and larger, the number of planar optical components used is increasing. The surface shape of the planar optical element will seriously affect the beam quality and beam focusing performance in the laser device. Therefore, the demand for dynamic measurement of the surface shape of planar optical components is increasingly urgent.
[0003] Static phase-shifting interferometers driven by traditional piezoelectric ceramics (such as Zygo phase-shifting laser interferometers in the United States) are susceptible to air flow disturbance and vibration because they obtain the measured wavefront phase results by pha...