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Snapshot Imaging Spectrometer Achromatic and Distortion Relay Imaging System

An imaging spectrometer and imaging system technology, applied in the directions of instruments, optics, optical components, etc., can solve the problems of low illuminance of edge field imaging, the depth of field does not meet the imaging requirements, and unfavorable miniaturization, and achieves suppression of stray light effects and processing. The technology is mature and the effect of preventing spectrum crosstalk

Active Publication Date: 2022-03-22
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The present invention solves the problem that the existing relay imaging optical system of the snapshot imaging spectrometer has a large number of lenses, which is not conducive to miniaturization; the imaging illumination of the edge field of view is low; the low telecentricity leads to serious distortion and crosstalk of the map; the depth of field does not meet the highest step height To meet the requirements of image plane imaging and other issues, a snapshot imaging spectrometer achromatic aberration and distortion relay imaging system is provided

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  • Snapshot Imaging Spectrometer Achromatic and Distortion Relay Imaging System

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Embodiment Construction

[0025] Now in conjunction with embodiment, appended Figure 1-8 The present invention is further described:

[0026] The Abbe number of an ordinary refractive element is expressed as:

[0027]

[0028] The Abbe number of a diffractive element is expressed as:

[0029]

[0030] In formula (1) (2), υ 1 is the Abbe number of ordinary refraction element, n 0 Indicates the long-wavelength refractive index, n 1 Indicates the central wavelength refractive index, n 2 Indicates the short-wavelength refractive index; υ 2 is the Abbe number of the diffraction element, λ 0 Indicates the long wavelength, λ 1 Indicates the central wavelength, λ 2 Indicates short wavelength;

[0031] It can be seen from the above formula that the dispersion of the diffraction element has nothing to do with the material of the element, but only with the wavelength. Diffraction elements have negative dispersion characteristics, while refraction elements have positive dispersion characteristics....

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Abstract

The achromatic and distortion-free relay imaging system of a snapshot imaging spectrometer relates to the technical field of snapshot imaging spectroscopy, and solves the problems of severe distortion of the infrared optical system, lack of achromatic ability, and large volume and weight in the existing snapshot imaging spectrometer. From left to right along the propagation direction of the optical path, it includes step microreflectors, light beam splitters, light compensation plates, relay imaging lenses, detector windows, detector cold diaphragms and detector arrays; Central optical path design, the use of germanium and silicon materials and focal power matching together to achieve system achromatism, the edge illumination of the image plane corresponding to the large field of view is close to 90%, the transfer value at 17lp / mm is close to the diffraction limit, and the image plane is distorted Less than -0.025%, the depth of field of the system meets the requirements of the spectrometer system. Design results: when imaging with different step heights, the maximum change of the MTF value of the system does not exceed 0.01. The relay system achieves 100% cold aperture matching, avoiding stray light and cold Reflection effects without vignetting.

Description

technical field [0001] The present invention relates to the technical field of snapshot imaging spectroscopy, in particular to a mid-wave infrared band, and a snapshot imaging spectrometer based on high-level multi-level micro-mirrors and low-level multi-level micro-mirrors. Achromatic and distortion-free relay imaging system. Background technique [0002] In recent years, with the continuous development and maturity of spectroscopy, spectroscopy has become a common method for us to identify material types and obtain material information. In many high-tech fields, such as space measurement, resource exploration, environmental monitoring, meteorological monitoring and other fields, people hope to obtain material image information while obtaining material spectral information, which promotes the development of imaging spectroscopy technology. Imaging spectroscopy is a means to simultaneously acquire the image information and spectral information of the target. The image inform...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B13/22G02B13/18G02B27/00
CPCG02B13/22G02B13/18G02B27/0025
Inventor 梁静秋陈宇鹏吕金光王惟彪秦余欣陶金赵百轩赵莹泽郑凯丰
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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