Doping device and doping method for heavily-antimony-doped Czochralski silicon
A single crystal silicon, heavy doping technology, applied in the direction of single crystal growth, single crystal growth, chemical instruments and methods, etc., can solve the problem of increasing seed crystal contamination, dopant splashing, slow doping of through holes, etc. problem, achieve the effect of shortening the doping time, improving the stability of doping, and avoiding splashing
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[0042] Taking a 6-inch [100] oriented single crystal with a 16-inch thermal field as an example, select the original doping device (structure such as figure 1 shown) and the doping device of the present invention (such as Figure 6 shown) doping the single crystal. (1) Statistics of different doping devices and the time required for the doping process; (2) Statistics of the resistivity of the single crystal head under the same doping amount and DBT time (5 hours) using different doping devices.
[0043] The specific doping method and related parameters of the original doping device are as follows:
[0044] (1) The molten polysilicon is stable at a certain temperature for 2 hours at a pressure of 20 Torr and a gas flow rate of 60 slpm;
[0045] (2) Close the isolation valve to separate the upper and lower furnace chambers, and the upper furnace chamber is inflated to 720 Torr to open;
[0046] (3) The seed crystal is removed, a doping device is installed, and the furnace doo...
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