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Device and method for measuring line width of infrared band chemical laser

A chemical laser and infrared band technology, applied in the field of spectral measurement, can solve the problems of high laser power stability and achieve the effects of low cost, fast measurement and simple operation

Active Publication Date: 2021-06-29
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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Problems solved by technology

However, this method requires high power stability of the laser, and requires a long-distance delay fiber in the measurement optical path, and an optical power amplifier in the loop self-heterodyne. and mid-wave infrared chemical lasers, it is difficult to make practical measurements of linewidth using this method

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  • Device and method for measuring line width of infrared band chemical laser
  • Device and method for measuring line width of infrared band chemical laser
  • Device and method for measuring line width of infrared band chemical laser

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Embodiment Construction

[0027] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0028] see figure 1 , the embodiment of the present invention includes:

[0029] A device for measuring the linewidth of an infrared band chemical laser, mainly comprising a chemical laser 1, a narrow linewidth laser 9, and a data acquisition card 6, and a first beam splitter is sequentially connected between the narrow linewidth laser 9 and the chemical laser 1 10. Beam combiner 2. Said chemical laser 1 and the laser output of narrow linewidth laser 9 combine beams, and input data acquisition card 6 after passing through fast response detector 3, radio frequency filter 4, power detector 5 successively; Said narrow linewidth laser 9 outputs The...

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Abstract

The invention discloses a device for measuring infrared band chemical laser linewidth. The device mainly comprises a chemical laser, a narrow linewidth laser and a data acquisition card, wherein laser beams outputted by the chemical laser and the narrow linewidth laser are combined, sequentially pass through a fast response detector, a radio frequency filter and a power detector and then are inputted into the data acquisition card; narrow-linewidth laser reflected by a narrow-linewidth laser device passes through an optical multi-pass absorption cell and a photoelectric detector, and a signal outputted by the photoelectric detector is inputted into the data acquisition card; the narrow-linewidth laser reflected by the narrow-linewidth laser device is inputted into a wavelength meter through a reflecting mirror in sequence, and the wavelength meter outputs data and inputs the data into the data acquisition card. The invention further discloses a method for measuring the infrared band chemical laser line width. The method is high in measurement precision and simple and convenient in test process, and an effective method is provided for accurately and rapidly measuring the line width of the infrared band chemical laser for engineering application.

Description

technical field [0001] The invention relates to the technical field of spectrum measurement, in particular to a device and method for precisely measuring the line width of an infrared band chemical laser based on laser heterodyne technology. Background technique [0002] Infrared band chemical lasers have the advantages of short wavelength, high output power, and good beam quality, and play an important role in the field of optoelectronic engineering. The linewidth of the laser is one of the important factors affecting the laser atmospheric transmission efficiency, and has a decisive impact on the final transmission performance evaluation. [0003] At present, there are two commonly used measurement methods for laser linewidth: spectrometer measurement method and Selfie frequency method. When the laser linewidth is less than 300MHz, the traditional measurement method based on grating spectrometer or Fourier transform spectrometer has been difficult to meet the actual needs....

Claims

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Application Information

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IPC IPC(8): G01J11/00G01M11/02
CPCG01J11/00G01M11/0271
Inventor 卢兴吉曹振松朱文越黄印博刘强黄宏华王英俭
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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