Continuous czochralski single crystal furnace and method capable of controlling oxygen content of monocrystalline silicon
A silicon oxygen content, single crystal furnace technology, applied in the direction of single crystal growth, single crystal growth, chemical instruments and methods, etc., can solve the problem of unsatisfactory fluidity, granular silicon and Siemens polysilicon can not meet the quality requirements, fluid control technology Unable to meet high-purity requirements and other problems, to achieve the effect of reducing COP native defects and boron-oxygen complexes, reducing silicon contamination, and uniform resistivity
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[0072] It should be noted that components in the various figures may be shown exaggerated for the purpose of illustration and are not necessarily true to scale. In the various figures, identical or functionally identical components are assigned the same reference symbols.
[0073] In the present invention, unless otherwise specified, "arranged on", "arranged on" and "arranged on" do not exclude the presence of intermediates between the two. In addition, "arranged on or above" only means the relative positional relationship between two parts, and under certain circumstances, such as after the product direction is reversed, it can also be converted to "arranged under or below", and vice versa Of course.
[0074] In the present invention, each embodiment is only intended to illustrate the solutions of the present invention, and should not be construed as limiting.
[0075] In the present invention, unless otherwise specified, the quantifiers "a" and "an" do not exclude the scen...
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