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Transmission electron microscope sample wire carrier, and production method and application thereof

A technology of transmission electron microscope samples and sample wires, applied in the direction of material analysis, instruments, and measuring devices using wave/particle radiation, to achieve stable performance, reduce damage, and reduce changes in contact effects

Pending Publication Date: 2021-07-23
BEIJING UNIV OF CHEM TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the characterization of in-situ heating is of great significance for the exploration of thermodynamic performance in material science. The realization of in-situ heating field is often realized by the electrothermal conversion of tungsten wire. There are big challenges in the pass rate

Method used

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  • Transmission electron microscope sample wire carrier, and production method and application thereof
  • Transmission electron microscope sample wire carrier, and production method and application thereof
  • Transmission electron microscope sample wire carrier, and production method and application thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0065] This embodiment provides a method for preparing a transmission electron microscope sample wire carrier, comprising the following steps:

[0066] 1) A spiral sample wire with a diameter of 0.2 mm is selected, wherein the material of the spiral sample wire is tungsten, the number of turns is 13, and the length is 6 mm;

[0067] 2) Place the two ends of the spiral sample wire on a semi-concave gasket cleaned with water and ethanol, wherein the semi-concave gasket is made of copper and has a thickness of 0.3mm;

[0068] 3) Then cover the two ends of the spiral sample wire with the welding pieces cleaned with water and ethanol respectively. The material of the welding pieces is copper, the size is 2mm×2mm square, and the thickness is 0.2mm; Sheet welding, wherein the welding temperature is 1200°C, and the welding time is 3s, so as to achieve the purpose of bonding and fixing the soldering sheet on the pad, and clamping and fixing the two ends of the spiral sample wire, and o...

Embodiment 2

[0078] The present invention provides an in-situ observation experiment of the TEM sample wire carrier prepared in Example 1, comprising the following steps:

[0079] Use the hydrothermal method to prepare ZIF-67 crystal, and disperse the product powder in ethanol to obtain dispersion liquid; After the surface of the sample wire is dried, move the transmission electron microscope sample wire stage to the transmission electron microscope. During the observation, a current was applied to the TEM sample wire stage, and the corresponding measured temperature was 200°C, and recorded and photographed at this temperature as follows: Figure 6 ~ Figure 8 shown.

[0080] The result is as Figure 6 ~ Figure 8 As shown, the results show that when the TEM sample wire stage prepared in Example 1 is used for in-situ observation of the TEM, it is found that it has a good effect on the real-time heating of the sample (200 ° C) and the application of in-situ observation.

Embodiment 3

[0082] This embodiment provides a method for preparing a transmission electron microscope sample wire carrier, comprising the following steps:

[0083] 1) A spiral sample wire with a diameter of 0.3 mm is selected, wherein the material of the spiral sample wire is tungsten, the number of turns is 12, and the length is 7 mm;

[0084] 2) Place the two ends of the spiral sample wire on a semi-concave gasket cleaned with water and ethanol, wherein the semi-concave gasket is made of titanium and has a thickness of 0.3 mm;

[0085] 3) Then cover the two ends of the spiral sample wire with the welding pieces cleaned with water and ethanol respectively, wherein the material of the welding pieces is aluminum, the specification is a circle with a diameter of 3mm, and a thickness of 0.1mm; Welding and melting of the soldering sheet, wherein the welding temperature is 700°C, and the welding time is 2s, so as to achieve the purpose of bonding and fixing the soldering sheet on the gasket, a...

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Abstract

The invention discloses a transmission electron microscope sample wire carrier, and a production method and an application thereof. The transmission electron microscope sample wire carrier comprises a sample wire, a gasket and soldering lugs, wherein the gaskets are positioned at two end parts of the sample wire; the soldering lugs are located at the two ends of the sample wire and fixed to the surface of the gasket; and two end parts of the sample wire are fixed between the gasket and the soldering lugs. The invention also provides the production method and the application of the transmission electron microscope sample wire carrier. Damage to parts in the machining process can be greatly reduced, a change of the direct contact effect of the sample wire and the gasket in the machining process is decreased, and machining repeatability is guaranteed.

Description

technical field [0001] The invention relates to the technical field of transmission electron microscope sample rods. More specifically, it relates to a transmission electron microscope sample wire carrier and its preparation method and application. Background technique [0002] Transmission electron microscopy (TEM) uses short-wavelength electrons as a light source, enabling resolution that cannot be achieved with optical microscopy. Because of its ultra-high resolution, it has become an indispensable means of characterization in the fields of materials and life sciences. In situ characterization at the atomic scale is of great significance for the exploration of process analysis, so the development of in situ environmental transmission electron microscopy is urgently needed. In situ TEM technique is the most intuitive method to characterize the morphology changes of catalysts in real time. By introducing light, electricity, and heat signals into TEM observations, atomic-...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2204
CPCG01N23/2204
Inventor 王丹赵志建蒲源王洁欣陈建峰
Owner BEIJING UNIV OF CHEM TECH
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