Unlock instant, AI-driven research and patent intelligence for your innovation.

Electroplating process of silicon wafer structure with TSV metal columns

An electroplating process and a technology of metal pillars, which are applied in the direction of circuits, electrical components, and electrical solid devices, can solve problems such as the exchange of difficult potions, the limitation of adapter boards, and the limitation of the application range of radio frequency modules, etc., to achieve convenient electroplating and speed up The effect of replacement

Pending Publication Date: 2021-07-23
浙江集迈科微电子有限公司
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the RF chip needs to be grounded and interconnected at the bottom of the adapter board, so it is necessary to dig a cavity on the adapter board to embed the RF chip and the auxiliary chip into the adapter board. Some chips are thicker, and the thickness of the adapter board There are also higher requirements, but the adapter board is often limited by the depth of TSV technology and cannot be made too thick, which greatly limits the application range of RF modules
The main reason why TSV cannot be made too deep is that the bottom of the deep hole TSV is a blind hole structure, it is difficult to enter the chemical solution, and it is difficult to exchange the chemical solution during electroplating, which is not conducive to the electroplating.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electroplating process of silicon wafer structure with TSV metal columns
  • Electroplating process of silicon wafer structure with TSV metal columns
  • Electroplating process of silicon wafer structure with TSV metal columns

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] An electroplating process with a silicon silicon structure with TSV metal columns, including the following steps:

[0030] Step S1, the TSV blind hole 102 is fabricated on the upper surface of the silicon sheet 101, and the lower surface of the thinning silicon wafer 101 causes the bottom end of the TSV blind hole 102 to form a through hole 102 ', in the through hole 102' sidewall and wafer 101 On the upper surface, a passivation layer 103 is produced;

[0031] like figure 1 As shown, the TSV blind hole 102 is produced on the upper surface of the silicon wafer 101 by a photolithography etching process, a hole diameter of 1 μm, and a depth of 10 μm;

[0032] like figure 2 As shown, the reverse surface of the thinned silicon wafer 101 causes the TSV blind hole 102 to form a through hole 102 ';

[0033] like image 3 As shown, in the through hole 102 'sidewall and the silicon wafer 101, the lower surface is produced by a thermal oxygen process, and the thickness of the passivat...

Embodiment 2

[0040] An electroplating process with a silicon silicon structure with TSV metal columns, including the following steps:

[0041] Step S1, the TSV blind hole 102 is made on one surface of the silicon sheet 101, and the other side of the thinning the silicon wafer 101 causes the bottom end of the TSV blind hole 102 to form a through hole 102 ', on the surface of the through hole 102' side wall and the silicon film 101 surface Production of passivation layer 103;

[0042] The TSV blind hole 102 is produced on the upper surface of the silicon wafer 101 by a lithographic etching process, a hole diameter of 500 μm, and a depth of 500 μm;

[0043] The lower surface of the thinning silicon wafer 101 causes the TSV blind hole 102 to expose the through hole 102 ';

[0044] The passivation layer 103 is produced by the film deposition process by the thin film deposition process in the upper and lower surface of the through hole 102 'side wall and the silicon wafer 101, and the thickness of t...

Embodiment 3

[0050] An electroplating process with a silicon silicon structure with TSV metal columns, including the following steps:

[0051] Step S1, the TSV blind hole 102 is made on one surface of the silicon sheet 101, and the other side of the thinning the silicon wafer 101 causes the bottom end of the TSV blind hole 102 to form a through hole 102 ', on the surface of the through hole 102' side wall and the silicon film 101 surface Production of passivation layer 103;

[0052] The TSV blind hole 102 is produced by a lithographic etching process, and a TSV blind hole 102 is produced with a hole diameter of 1000 μm and a depth of 1000 μm.

[0053] The lower surface of the thinning silicon wafer 101 causes the TSV blind hole 102 to expose the through hole 102 ';

[0054] On the through hole 102 'sidewall and the silicon wafer 101, the lower surface is formed by a film deposition process, and the thickness of the passivation layer 103 is 10 μm;

[0055] Step S2, a metal layer is fabricated as ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Hole diameteraaaaaaaaaa
Depthaaaaaaaaaa
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention relates to the technical field of semiconductors, and particularly relates to an electroplating process of a silicon wafer structure with TSV metal columns. An electroplating process method comprises the following steps: forming a through hole in a silicon wafer, and manufacturing a passivation layer in the through hole and on the surface of the silicon wafer; manufacturing seed layers for electroplating on the front and back surfaces of the silicon wafer; placing the silicon wafer in an electroplating cavity, spraying an electroplating liquid from one surface of the silicon wafer, and applying a suction force to the other surface of the silicon wafer so that the electroplating liquid passes through the through holes in the surface of the silicon wafer; and applying a current to the surface of the silicon wafer, depositing metal in the through hole till that metal is deposited in the through hole and on the two surfaces of the silicon wafer, polishing the front surface and the back surface of the silicon wafer, and acquiring the silicon wafer structure with the TSV metal columns. According to the invention, a through hole process is adopted to replace an original blind hole process, the conduction of the deep TSV through hole is realized by manufacturing the seed layers on the two sides, and then the replacement of the electroplating liquid in the TSV is accelerated by spraying the electroplating liquid on the front surface of the adapter plate and absorbing the electroplating liquid on the back surface of the adapter plate so that the side wall electroplating of the deep hole is realized.

Description

Technical field [0001] The present invention relates to the field of semiconductor technology, and more particularly to an electroplating process of a silicon silicon structure with a TSV metal column. Background technique [0002] The millimeter wave radio technology has developed rapidly in the semiconductor industry, and its fields are widely used in high-speed data communication, automotive radar, airborne missile tracking system and spatial spectroscopy and imaging. The 2018 market reached 1.1 billion US dollars and became an emerging industry. The new application has made new requirements for the electrical performance, compact structure and system reliability of the product. For wireless transmitting and receiving systems, it is still not integrated to the same chip (SOC), so different chips need to include a radio frequency unit. , Filters, power amplifiers, etc. Integrate functions that implement transmit and receive signals in a separate system. [0003] However, the ra...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/768
CPCH01L21/76873H01L21/76879H01L2221/1068H01L2221/1084
Inventor 黄雷冯光建高群郭西顾毛毛
Owner 浙江集迈科微电子有限公司