Electroplating process of silicon wafer structure with TSV metal columns
An electroplating process and a technology of metal pillars, which are applied in the direction of circuits, electrical components, and electrical solid devices, can solve problems such as the exchange of difficult potions, the limitation of adapter boards, and the limitation of the application range of radio frequency modules, etc., to achieve convenient electroplating and speed up The effect of replacement
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Embodiment 1
[0029] An electroplating process with a silicon silicon structure with TSV metal columns, including the following steps:
[0030] Step S1, the TSV blind hole 102 is fabricated on the upper surface of the silicon sheet 101, and the lower surface of the thinning silicon wafer 101 causes the bottom end of the TSV blind hole 102 to form a through hole 102 ', in the through hole 102' sidewall and wafer 101 On the upper surface, a passivation layer 103 is produced;
[0031] like figure 1 As shown, the TSV blind hole 102 is produced on the upper surface of the silicon wafer 101 by a photolithography etching process, a hole diameter of 1 μm, and a depth of 10 μm;
[0032] like figure 2 As shown, the reverse surface of the thinned silicon wafer 101 causes the TSV blind hole 102 to form a through hole 102 ';
[0033] like image 3 As shown, in the through hole 102 'sidewall and the silicon wafer 101, the lower surface is produced by a thermal oxygen process, and the thickness of the passivat...
Embodiment 2
[0040] An electroplating process with a silicon silicon structure with TSV metal columns, including the following steps:
[0041] Step S1, the TSV blind hole 102 is made on one surface of the silicon sheet 101, and the other side of the thinning the silicon wafer 101 causes the bottom end of the TSV blind hole 102 to form a through hole 102 ', on the surface of the through hole 102' side wall and the silicon film 101 surface Production of passivation layer 103;
[0042] The TSV blind hole 102 is produced on the upper surface of the silicon wafer 101 by a lithographic etching process, a hole diameter of 500 μm, and a depth of 500 μm;
[0043] The lower surface of the thinning silicon wafer 101 causes the TSV blind hole 102 to expose the through hole 102 ';
[0044] The passivation layer 103 is produced by the film deposition process by the thin film deposition process in the upper and lower surface of the through hole 102 'side wall and the silicon wafer 101, and the thickness of t...
Embodiment 3
[0050] An electroplating process with a silicon silicon structure with TSV metal columns, including the following steps:
[0051] Step S1, the TSV blind hole 102 is made on one surface of the silicon sheet 101, and the other side of the thinning the silicon wafer 101 causes the bottom end of the TSV blind hole 102 to form a through hole 102 ', on the surface of the through hole 102' side wall and the silicon film 101 surface Production of passivation layer 103;
[0052] The TSV blind hole 102 is produced by a lithographic etching process, and a TSV blind hole 102 is produced with a hole diameter of 1000 μm and a depth of 1000 μm.
[0053] The lower surface of the thinning silicon wafer 101 causes the TSV blind hole 102 to expose the through hole 102 ';
[0054] On the through hole 102 'sidewall and the silicon wafer 101, the lower surface is formed by a film deposition process, and the thickness of the passivation layer 103 is 10 μm;
[0055] Step S2, a metal layer is fabricated as ...
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Abstract
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