Digital twin behavior constraint method and system for TPM equipment management

Abstract

The invention provides a digital twin behavior constraint method and system for TPM equipment management, and relates to the technical field of computers. The method comprises the following steps: modeling target equipment by utilizing 3D modeling software to obtain a three-dimensional structure of the target equipment; constructing a static model of the target equipment according to the three-dimensional structure, and adding dynamic attributes into the static model through simulation modeling to construct a dynamic model of the target equipment; extracting historical data of each stage in target equipment management to obtain basic data information; obtaining training data, and using the training data to train a digital twin initial model to obtain a trained digital twin model; and acquiring parameters of each stage in TPM equipment management, and inputting the parameters into the digital twin model to obtain a trend prediction result of the TPM equipment management. Therefore, trend prediction and analysis are carried out on TPM equipment management, and the purpose of predicting trends of running states of TPM equipment is achieved.

Description

technical field [0001] The present invention relates to the field of computer technology, in particular to a digital twin behavior constraint method and system for TPM device management. Background technique [0002] Digital Twin (Digital Twin) technology is currently a research hotspot at home and abroad. It is a concept that transcends reality. It can be regarded as a digital mapping system of one or more important and interdependent equipment systems. , sensor update, operation history and other data, integrate multi-disciplinary, multi-physical quantity, multi-scale, multi-probability simulation process, complete the mapping in the virtual space, so as to reflect the whole life cycle process of the corresponding physical equipment. [0003] Product lifecycle management (PLM), as an efficient commercial product management method, runs through its entire lifecycle from the generation of product design concepts to its scrapping and elimination. Although PLM can obtain big ...

AI Technical Summary

Problems solved by technology

Although PLM can obtain big data related to each stage of the life cycle including design, manufacturing, and service, there are still problems such as that the data at each stage is usually isolated, scattered, and stagnant, and it is difficult for the manufacturer to maintain the product during the use of the product. Defects such as real-time control and response

These defects will lead to inefficient design, manufacturing and service stages of products, and a low level of intelligence and sustainability

The existing technology cannot reasonably define the behavior of each stage in the product life cycle management, and it is also impossible to restrict the behavior of the life cycle management of the TPM device management, and it is impossible to realize the whole life cycle of the device from discovering problems, analyzing problems to solving problems closed-loop management

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