Three-dimensional separated gate trench charge storage type IGBT and manufacturing method thereof
A technology of charge storage and charge storage layer, which is applied in the manufacture of circuits, electrical components, semiconductors/solid-state devices, etc., can solve problems such as increasing gate capacitance, deteriorating short-circuit safe working area, and slowing down the switching speed of devices. Forward conduction voltage drop, improve breakdown voltage and reliability, and reduce on-state loss
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[0078] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.
[0079] A three-dimensional separated gate trench charge storage type IGBT provided by Embodiment 1 of the present invention, its half-cell structure and the cross-sections along AB line, CD line, EF line and GH line are as follows: Figure 2-6 as shown,
[0080] Define the three-dimensional direction of the device with a three-dimensional rectangular coordinate system: define the horizontal direction of the device as the X-axis direction, the vertical direction of the device as the Y-axis direction, and the longitudinal direction of the device, that is, the third dimension direction, as the Z-axis direction. The cell structure includes: along the Y-axis axis direction, the back collector metal 11, P-type collector r...
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