Double 90-degree deflection triple quadrupole plasma mass spectrometer

Abstract

The invention discloses a double 90-degree deflection triple quadrupole plasma mass spectrometer. Double 90-degree ion deflection focusing assemblies and a triple quadrupole are introduced, so that positive ions are separated from a large number of electrons and neutral particles after passing through a first 90-degree deflection focusing assembly after passing through an interception cone; the separated ions pass through a first-stage quadrupole rod and a collision pool and then pass through a second 90-degree deflection focusing assembly, interference components in to-be-detected positive ions are separated, and finally the to-be-detected positive ions reach a second-stage quadrupole rod and a detection system for detection of the to-be-detected ions. The background noise of the instrument is greatly reduced, incoherent components cannot enter a precise quadrupole rod separation system, the quadrupole rod separation system and a detection system are not polluted, multiple analysis modes are achieved through the design of a double-detector mode, and the application environment of the whole mass spectrometer system is wider and more flexible. The triple quadrupole rod successfully solves mass spectrum interference which cannot be solved by a traditional single quadrupole rod.

Description

technical field [0001] The invention belongs to the technical field of plasma mass spectrometers; in particular, it relates to a triple quadrupole plasma mass spectrometer with double 90-degree deflection. Background technique [0002] ICP-MS is mainly composed of a sampling system, an ICP ion source, an interface part, an ion transmission system, a mass analyzer, and an ion detection system. The sample enters the ICP ion source through the sampling system and generates a large amount of positive ions at the same time. electrons, photons, neutral particles, etc. Since photons and neutral particles travel in a straight line, the analyzed ions to be measured can be deflected off-axis or by using photon baffles or 90-degree turns to separate them from uncharged particles (photons and neutral particles), and then pass through Focuses and guides the ions to be analyzed from the interface area to the mass spectrometer separation system. [0003] The ion transmission detection sy...

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Problems solved by technology

[0003] The ion transmission detection system of commercialized mass spectrometers on the market in the early days was mainly designed in the form of photon baffle or off-axis transmission. Ion deposition causes lens voltage changes and instrument drift, resulting in reduced ion transmission efficiency. At the same time, the design of the off-axis ion optical system structure is relatively complicated, and the cleaning and maintenance of components are extremely complicated. At the same time, traditional plasma mass spectrometers are all single quadrupole structure, so that when the mass spectrometer is working, because there may be other unknown ions in the electron beam to be measured except for the selected mass number, these ions will be released to the mass spectrometer when the mass spectrometer is working. The results are interfered, which leads to errors in the detection results, and the accuracy is not high. Therefore, the appearance of a double 90-degree deflection triple quadrupole plasma mass spectrometer is imminent

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