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Method for improving performance of device by optimizing metal etching

A metal and performance technology, applied in the field of optimizing metal etching to improve device performance, can solve problems such as inability to effectively reduce device series resistance, no ability to use heat dissipation, and difficulty in reducing distances, so as to improve device performance, control metal morphology, The effect of shortening the distance

Pending Publication Date: 2022-02-11
浙江光特科技有限公司
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, due to the limitation of the existing processing technology window, the distance from the hole to the waveguide is difficult to reduce, and the series resistance of the device cannot be effectively reduced. Although metal has good thermal conductivity, the existing methods have not utilized its characteristics to improve heat dissipation. ability

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  • Method for improving performance of device by optimizing metal etching
  • Method for improving performance of device by optimizing metal etching

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Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] like Figure 1 to Figure 5 As shown, in an embodiment of the present invention, a method for optimizing metal etching to improve device performance includes the following steps:

[0024] A hole structure is formed on the upper cladding layer of the ridge optical waveguide;

[0025] metal sputtering;

[0026] Carry out the first photolithography and etching of the metal, the photolithography only exposes a small area, and the focal length is aimed at t...

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Abstract

The invention relates to a method for improving the performance of a device by optimizing metal etching. The method comprises the following steps of: forming a hole structure in an upper cladding of a ridge-shaped optical waveguide; carrying out metal sputtering; etching metal for the first time, aiming a photoetching focal length at the upper part of the ridge-shaped optical waveguide so as to accurately control the tiny distance of the metal; and etching the metal for the second time, concentrating the photoetching focal length in other areas with lower positions to form a final metal shape. According to the method, a smaller distance from the hole to the waveguide can be adapted by optimizing the metal etching process, so that PiN series resistance can be reduced by reducing the distance, and the device performance is improved. The shape of the metal is changed, the metal is distributed on the side wall of the waveguide, the heat dissipation capacity can be improved, the temperature generated in a gas part operation process is not excessively accumulated, and the device stable performance is kept.

Description

technical field [0001] The invention relates to a method for optimizing metal etching and improving device performance. Background technique [0002] Ultra-large-capacity and ultra-high-speed information systems need to use photons instead of electrons as carriers, so optical devices and integrated circuits play a key role. Various optical devices and optoelectronic devices such as optical waveguides, optical modulators, and optical detectors can be made of silicon-based materials. [0003] Optical detectors and optical modulators are very important components in the receiving and transmitting end of silicon photonic integrated circuits. The modulator is a key device for intra-chip optical interconnection in next-generation processors, and its performance directly restricts the development of intra-chip optical interconnection. Existing silicon-based modulators still have various deficiencies in terms of speed, power consumption, and thermal stability. It is highly challen...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B6/132G02B6/136G02B6/122G02B6/12
CPCG02B6/132G02B6/136G02B6/122G02B6/12G02B2006/12142
Inventor 龚正致李超翰谢建平
Owner 浙江光特科技有限公司
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