Method for improving performance of device by optimizing metal etching
A metal and performance technology, applied in the field of optimizing metal etching to improve device performance, can solve problems such as inability to effectively reduce device series resistance, no ability to use heat dissipation, and difficulty in reducing distances, so as to improve device performance, control metal morphology, The effect of shortening the distance
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[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0023] like Figure 1 to Figure 5 As shown, in an embodiment of the present invention, a method for optimizing metal etching to improve device performance includes the following steps:
[0024] A hole structure is formed on the upper cladding layer of the ridge optical waveguide;
[0025] metal sputtering;
[0026] Carry out the first photolithography and etching of the metal, the photolithography only exposes a small area, and the focal length is aimed at t...
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