An Automatic Inspection Method of Capacitance Parameters in Circuit Schematic Diagram

Abstract

The invention discloses an automatic inspection method for capacitance parameters in a circuit schematic diagram, which includes: deriving information from the circuit schematic diagram, extracting a power supply network; judging the resistance value of the resistor in the network; and judging the magnetic beads and inductance in the network , IC chip, if there are magnetic beads and inductance, it will be regarded as a short circuit. If there is no magnetic bead or inductance, other judgments will be made. If there is an IC chip, it will be regarded as an open circuit. If there is no IC chip, other judgments will be made; and it will be judged that the diodes in the network are connected correctly and reversely. , define the positive and negative poles for the diode, the power terminal is connected to the positive pole and the power supply terminal is connected to the negative pole to open the circuit; and to judge the connection relationship of the switch tube in the network, define the Vdd2 pin and Vdd3 pin as short circuit; extract the withstand voltage and capacitance of the capacitor in the effective path Capacitance: Parallel calculation of capacitance load, comparison of withstand voltage and power supply voltage and margin calculation, the automatic inspection method of the present invention is not easy to omit information, does not require complicated calculations, and can improve the reliability, stability and detection of the circuit precision.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to an automatic inspection method for capacitance parameters in circuit schematic diagrams. Background technique [0002] Capacitors are widely used in industrial, civil, commercial and other fields, and the capacitance value can effectively reflect the reliability and stability of the system. At the same time, the change of capacitance can more sensitively reflect some local defects, such as insulation Whether it is damp and deteriorated, whether the components are broken down, whether there is oil leakage, etc. Therefore, the measurement of the capacitance value is a key technology to confirm the reliability of the system. [0003] The Chinese invention whose publication number is CN113219257A discloses a parameter measurement circuit of a capacitor and an ESR capacity measuring instrument of a capacitor, which outputs a digital drive signal through a control circuit; a digital...

AI Technical Summary

Problems solved by technology

[0003] The Chinese invention whose publication number is CN113219257A discloses a parameter measurement circuit of a capacitor and an ESR capacity measuring instrument of a capacitor, which outputs a digital drive signal through a control circuit; a digital-to-analog conversion circuit converts a digital drive signal into an analog drive voltage; the analog drive voltage The frequency is associated with the digital driving signal; the driving circuit amplifies the analog driving voltage to output the driving amplified voltage; the voltage divider circuit divides the driving amplified voltage to output the first voltage; the capacitor under test is charged and discharged according to the first voltage to output The first voltage to be measured and the first current to be measured; the voltage detection circuit detects the first voltage to be measured and the first voltage to output a first voltage detection signal; the current detection circuit detects the first current to be measured to output a first Current detection signal; the control circuit obtains the initial capacitance parameter according to the first voltage detection signal and the first current detection signal, but the parameter measurement circuit has low detection accuracy when testing the capacitance parameter

Images