Wheat basal stem rot resistance identification method

An identification method and stem base rot technology are applied in the field of wheat stem base rot resistance identification, which can solve the problems affecting FCR resistance and long cycle.

Active Publication Date: 2022-03-25
CHINA AGRI UNIV
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Problems solved by technology

Field trials are often affected by many factors, such as resident pathogen populations in the soil, soil types, and weather conditions

Method used

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  • Wheat basal stem rot resistance identification method
  • Wheat basal stem rot resistance identification method
  • Wheat basal stem rot resistance identification method

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preparation example Construction

[0030] The preparation method of the spore suspension of the present invention preferably comprises: after cultivating the spores of the Fusarium with carboxymethylcellulose medium (CMC), mixing with Tween 20 to obtain the spore suspension; The volume of Tween 20 was 0.5% of the volume of the spore suspension.

[0031] The present invention is not particularly limited to the type of Fusarium, such as the Fusarium pseudogamine isolate WZ-8A used in the examples (Jin, Identification of a novel genomic region associated resistance to Fusarium crown rot in wheat.2020 ), but it cannot only be regarded as the entire protection scope of the present invention. In the embodiment of the present invention, the WZ-8A is preferably cultured on a 1 / 2 potato dextrose agar plate at room temperature for 5 to 7 days. When the white hyphae grow on the plate and show red pigmentation, the Take out 10 pieces of 6 mm × 4 mm medium with mycelia, and then transfer them to an Erlenmeyer flask contain...

Embodiment 1

[0043] 1. Plant material

[0044] The best identification method was determined using wheat cultivars 04zhong 36 (04z36) and Xinmai 26 (XM) with moderate resistance to FCR and high susceptibility to FCR. Using 92 hexaploid wheat lines derived from wild emmer wheat as materials, the validity and repeatability of the optimized identification method were verified.

[0045] 2. Preparation of inoculum solution

[0046] Fusarium graminearum isolate WZ-8A, a dominant pathogenic species in the Huanghuai wheat region of my country, provided by Professor Li Hong and Li Honglian from the Plant Protection College of Henan Agricultural University, was used for FCR inoculation. The isolates were grown on 1 / 2 strength potato dextrose agar plates for 5-7 days at room temperature. When white hyphae grow on the plate and show red pigmentation at the bottom, remove 10 pieces of 6 mm × 4 mm medium with mycelium from the plate, and then transfer it to a medium containing 400 mL of carboxymethylc...

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Abstract

The invention provides a wheat basal stem rot resistance identification method, and relates to the technical field of disease resistance detection. According to the identification method, the spore suspension is injected into wheat seedling stems growing in a greenhouse for FCR inoculation, and phenotype identification can be carried out 15 days after injection (or 22 days after planting) by determining the optimal inoculation concentration and injection time point. According to the identification method disclosed by the invention, the FCR is inoculated by directly injecting the spore suspension into the stem part of the wheat seedling for the first time, and the disease assessment can be completed within 22 days according to the inoculation concentration and the injection time point. According to the identification method, the screening efficiency can be remarkably improved, and large-scale germplasm screening and gene function research are facilitated.

Description

technical field [0001] The invention belongs to the technical field of resistance detection, and in particular relates to a method for identifying resistance to wheat stem rot. Background technique [0002] Base stem rot (FCR) is a serious soil-borne fungal disease in many wheat-growing regions of the world. Typical symptoms of FCR include tan discoloration of the stems of infected plants and white spikes at mature stages due to stem necrosis affecting grain filling. FCR can be caused by a variety of Fusarium fungi, of which Fusarium graminearum is the most common pathogen. Studies have shown that most wheat varieties worldwide are poorly resistant to FCR, with only a few genotypes showing moderate resistance to the disease. FCR can cause significant yield losses in wheat producing areas. [0003] Reliable FCR assessment methods are essential for the identification of resistant germplasm and for host resistance studies. According to the test environment, there are curren...

Claims

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Application Information

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IPC IPC(8): C12Q1/18A01G7/06A01G13/00A01G22/20C12R1/645
CPCC12Q1/18A01G22/20A01G7/06A01G13/00Y02A40/10
Inventor 马骏李金龙解超杰孙其信许湘茹
Owner CHINA AGRI UNIV
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