Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Microwave frequency measurement method based on double optical frequency combs and stimulated Brillouin scattering

A technology of microwave frequency measurement and stimulated Brillouin, applied in the direction of electromagnetic transmitters, electromagnetic wave transmission systems, electrical components, etc., can solve the problem of high implementation cost, reduce the difficulty of implementation, improve real-time performance, and reduce the scan cycle Effect

Active Publication Date: 2022-04-05
NAT UNIV OF DEFENSE TECH
View PDF8 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, based on dual optical frequency combs, the flexible adjustment of scanning speed, scanning bandwidth and frequency resolution can be realized by using wavelength division multiplexing and time division multiplexing. However, this solution still requires a high-speed ADC, and the implementation cost is high.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Microwave frequency measurement method based on double optical frequency combs and stimulated Brillouin scattering
  • Microwave frequency measurement method based on double optical frequency combs and stimulated Brillouin scattering
  • Microwave frequency measurement method based on double optical frequency combs and stimulated Brillouin scattering

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, not to limit the present application.

[0042] In this application, a high-precision multi-microwave frequency measurement method based on dual optical frequency combs and stimulated Brillouin scattering is provided. This method is applied to microwave frequency measurement systems, such as figure 1 As shown, the microwave frequency measurement system includes: laser, optical frequency comb generator, dual parallel Mach-Zehnder modulator, erbium-doped fiber amplifier, stimulated Brillouin scattering effect structure, optical demultiplexer, optical power meter and A signal processing module, the method comprising:

[0043] Gener...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a high-precision multi-microwave frequency measurement method based on double optical frequency combs and stimulated Brillouin scattering, and the method comprises the steps: generating two paths of coherent optical frequency combs through employing the same laser, and enabling the two paths of coherent optical frequency combs to serve as optical carriers to be inputted into two double-parallel Mach-Zehnder modulators; and carrier suppression single side band modulation is carried out on the microwave signal to be measured and the scanning signal. The two paths of modulated optical signals are respectively used as signal light and pump light to be input into the stimulated Brillouin scattering effect structure, then the optical comb teeth are decomposed through the optical demultiplexer, and the frequency value of the signal to be measured can be estimated by measuring the power value of the optical signal output by each channel. In order to further improve the algorithm precision, an amplitude comparison function is established by using the measured optical power value to calculate a frequency measurement error, and frequency precise measurement can be realized by performing error correction on the frequency measurement value. By adopting the method, high-precision frequency measurement of a plurality of microwave signals can be realized, and the method has wide application value in the aspects of communication, radar, electromagnetic spectrum sensing and the like.

Description

technical field [0001] The present application relates to the technical field of microwave photonics and microwave signal frequency measurement, in particular to a high-precision multi-microwave frequency measurement method based on dual optical frequency combs and stimulated Brillouin scattering. Background technique [0002] Microwave signal parameter measurement is widely used in military and civilian fields such as communication, radar, and space perception, and frequency is one of the important parameters for sensing and evaluating microwave signals. It is used in electronic warfare receivers, radar early warning receivers, and spectrum monitoring There is an important demand in such equipment. Traditional microwave frequency measurement uses electrical domain signal processing technology, which has the advantages of high resolution and high flexibility. However, with the rapid development of microwave technology and the expansion of application fields, the operating f...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04B10/079H04B10/50
Inventor 张先玉安康乔晓强梁涛李勇
Owner NAT UNIV OF DEFENSE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products