Spectrally shaped X-ray inspection system
An inspection system and spectrum technology, applied in the field of X-ray inspection systems with spectral shaping, can solve the problems of no design, no effective control of X-ray intensity, etc., and achieve the effect of cost reduction
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[0022] A system for advantageously reducing environmental radiation exposure while providing the advantage of a highly penetrating x-ray beam is described below. A common theme of the various embodiments to be described below is the alternation of a low intensity, predominantly low energy x-ray spectrum with a low intensity, predominantly high energy spectrum.
[0023] refer to figure 1 , shows the x-ray spectrum emitted at 90° from a tungsten target bombarded with electrons at 3 MeV. The solid line, indicated by numeral 6, corresponds to the first x-ray spectrum produced by Monte Carlo simulation under specified conditions. The unfiltered first spectrum 6 is displayed on a logarithmic scale as a function of photon energy in MeV. (Although the solid line 6 is called "unfiltered" here, it is actually lightly filtered to reduce the intensity of x-rays below about 200 keV.) In the unfiltered first spectrum 6, about 50% of X-rays have energies below 500keV, and only 8% of x-ray...
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