Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Measuring apparatus of wide angle wide spectrum polarization beam splitting film characteristics

A technology of polarization beam splitting and measuring devices, which is applied in the directions of measuring devices, optical radiation measurement, spectrometry/spectrophotometry/monochromator, etc. It can solve the problems that the extinction ratio and limitation cannot be directly given

Inactive Publication Date: 2004-02-18
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing state-of-the-art Lambda series test devices for spectral measurement, if you want to meet the above measurement requirements, you need to make a large number of placement racks with different angles, and it cannot directly give the extinction ratio, so it is greatly limited in practical applications
Devices in this area have also been reported in some literatures, but they can only roughly measure the extinction ratio, or only measure the spectral characteristics of two polarized lights

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measuring apparatus of wide angle wide spectrum polarization beam splitting film characteristics
  • Measuring apparatus of wide angle wide spectrum polarization beam splitting film characteristics
  • Measuring apparatus of wide angle wide spectrum polarization beam splitting film characteristics

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] see first figure 1 , figure 1 It is a structural block diagram of the best embodiment of the measuring device for the characteristics of the wide-angle and wide-spectrum polarization beam-splitting film of the present invention. It can be seen from the figure that the composition of the measuring device for the characteristics of the polarization beam-splitting film of the present invention is to follow the main optical path in sequence It includes a wide-spectrum tungsten halogen light source 1, a monochromator 2, a pair of polarizing prisms 3, a beam splitter 5, an aperture 6, a conical prism 8, and an energy meter 10. The polarizing prism 3 is placed in a rotating On the platform 4, there is also a coupling lens 81 and an optical fiber 82 behind the aconic prism 8, and the tail ends of the sample to be measured 7, the aconic prism 8, the coupling lens 81 and the optical fiber 82 are all fixed together, and placed simultaneously On the rotatable platform 9. A cont...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A measurer for measuring the characteristics of wide-angle broad-spectrum polarizing split membrane is composed of light source, monochromator, polarizing prism, splitter, diaphragm, conic prism, energy meter, turntable A for holding the polarizing prism, turntable B for holding the conic prism and the specimen to be measured, and computer for controlling said turntables, and processing, displaying and printing data.

Description

technical field [0001] The invention relates to the spectrum measurement of thin films, in particular to a device for measuring the characteristics of a wide-angle and wide-spectrum polarization beam-splitting film. Background technique [0002] Network technology in the information age makes the need for sharing and collecting information increasingly prominent, which creates the greatest demand for super-large screen display. The traditional display technology that uses CRT as the source of image generation is due to its large size, heavy weight and its own brightness. The limitation has gradually become a bottleneck restricting its development, replaced by large-screen projection display systems based on LCD (Liquid Crystal Display), DLP (Digital Light Processing), and LCOS (Liquid Crystal on Silicon), except for DLP In addition to displays, projection display systems use optical components that include wide-angle, wide-spectrum polarization beamsplitters. The polarizing...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J3/28G01J3/42G01J3/44
Inventor 徐学科汤兆胜范正修邵建达
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products